“…On one hand, it has been shown that the LFN of the various forms of ISFETs investigated can originate from the solid-state part of the devices, in particular their conducting channel 2,8,[10][11][12]17,20,22 or surrounding dielectric layers 19,21 . On the other hand, there is evidence showing the ISFET LFN to be a result of the adsorption/desorption events occurring at the sensing surface of the devices 3,4,16,18,23 . Our previous work 16 concludes from experimental viewpoint that the LFN originating from the solid/liquid interface is of thermal nature and its amplitude is comparable with that from the semiconductor/oxide interface.…”