2010
DOI: 10.1016/j.actamat.2010.08.014
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Direct evidence for stress-induced texture evolution and grain growth of silver thin films upon thermal treatment and self-ion bombardment

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Cited by 25 publications
(9 citation statements)
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“…Our measurements show that the Cu foil was converted to a {111}<112> single crystal over an area of 2 cm by 8 cm. By contrast, the grains in thin metal films have a maximum size of a few millimeters (22)(23)(24)(25)(26)(27)(28)(29), by abnormal grain growth. CFA reproducibly yields (111) single-crystal foils up to 32 cm 2 ( fig.…”
Section: Single-crystal Metal Foils Produced By Contact-free Annealingmentioning
confidence: 99%
“…Our measurements show that the Cu foil was converted to a {111}<112> single crystal over an area of 2 cm by 8 cm. By contrast, the grains in thin metal films have a maximum size of a few millimeters (22)(23)(24)(25)(26)(27)(28)(29), by abnormal grain growth. CFA reproducibly yields (111) single-crystal foils up to 32 cm 2 ( fig.…”
Section: Single-crystal Metal Foils Produced By Contact-free Annealingmentioning
confidence: 99%
“…Texture development in polycrystalline thin films could also result from grain coalescence [47]. Grain coalescence was reported experimentally in metallic Cr, Au, and Ag thin films [48][49][50][51]. In ion-bombarded Ag thin films, it was reported that the texture changed from (111) to (200), which was accompanied by grain growth [51].…”
Section: Reasons For Grain Growthmentioning
confidence: 93%
“…The TEM micrographs show that grains have homogeneous structure throughout the entire thickness. Moreover, they show uniform distribution of defects (such as dislocations) and no indication of voids or bubbles at the interface with the substrate, the interface between the 50 nm microstructure template and the additional 450 nm material (marked in micrographs in red color), or at GBs [61,62]. We conclude that ion-induced damage during iGBE can be ignored.…”
Section: Discussionmentioning
confidence: 83%