2019
DOI: 10.1088/2053-1591/ab4be5
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Direct fabrication of Cd–In–S alloy quantum dots thin films

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Cited by 3 publications
(2 citation statements)
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“…Figure b shows the XRD patterns of Ni 12 P 5 , Ni 12 P 5 /CIS composites, and CIS. The diffraction peaks of CIS showed the characteristics of typical nanocrystals of CIS. , The main peaks of 32.72, 35.38, 41.74, 44.42, 46.96, and 48.96 corresponded to the (310), (002), (400), (330), (420), and (312) planes of Ni 12 P 5 , respectively (JCPDS no. 22-1190).…”
Section: Resultsmentioning
confidence: 99%
“…Figure b shows the XRD patterns of Ni 12 P 5 , Ni 12 P 5 /CIS composites, and CIS. The diffraction peaks of CIS showed the characteristics of typical nanocrystals of CIS. , The main peaks of 32.72, 35.38, 41.74, 44.42, 46.96, and 48.96 corresponded to the (310), (002), (400), (330), (420), and (312) planes of Ni 12 P 5 , respectively (JCPDS no. 22-1190).…”
Section: Resultsmentioning
confidence: 99%
“…It can be seen from the figure that the crystallinity of CIS was low. 49,50 The peaks of the In(OH) 3 /CIS composites, which were 22.27, 31.70, 39.07, 45.43, 51.16, 56.45, 66.20, 70.79, and 75.261, corresponding to the (200), ( 220), ( 222), (400), (420), (422), (440), (442), and (620) planes of In(OH) 3 , respectively (JCPDS 85-1338), proved that In(OH) 3 was successfully loaded on the surface of CIS. For the Ni 12 P 5 /In(OH) 3 /CIS series of samples (Fig.…”
Section: Preparation Process and Morphological Structural Analysismentioning
confidence: 99%