Direct imaging and confocal mapping of diamond films using luminescence and Raman scattering

Hayward, Ian; Baldwin, Kurt J.; Hunter, David M.; Batchelder, D. N.; Pitt, G. D.

doi:10.1016/0925-9635(94)05293-x

Cited by 39 publications

(15 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…2 Langmuir monolayers of the neat material were obtained on water and transferred to silver enhancing substrates. 4 The extremely weak signals produced by inelastic light scattering (Raman effect) may limit the use of Raman imaging of molecules on surfaces. 3 Raman mapping is obtained using a motorized microscope stage, which permits pointto-point spectral mapping of lines, areas and volumes using the Raman spectrum as a probe at each point.…”

Section: Introductionmentioning

confidence: 99%

Surface-enhanced resonance Raman scattering imaging of Langmuir-Blodgett monolayers of bis(benzimidazo)perylene on silver island films

Constantino

Aroca

2000

J. Raman Spectrosc.

View full text Add to dashboard Cite

Section: Introductionmentioning

confidence: 99%

Surface-enhanced resonance Raman scattering imaging of Langmuir-Blodgett monolayers of bis(benzimidazo)perylene on silver island films

Constantino

Aroca

2000

J. Raman Spectrosc.

View full text Add to dashboard Cite

“…3͑a͒ for a ͗100͘-oriented diamond film. 19 In addition to sharp contributions, photoluminescence spectra exhibit a characteristic broad band, observed in the 1.5-2.5 eV energy range ͑see Fig. We obtain a phonon energy of about 65 and 45 meV and a Huang-Rhys factor S of 0.4 and 0.8 for the N-V-V and N-V center, respectively, 5 indicating a weak-intermediate electron-phonon interaction (Sр1).…”

Section: B Photoluminescence Spectroscopymentioning

confidence: 79%

Defect structure, distribution, and dynamics in diamond-on-silicon optoelectronic devices

Rossi

Salvatori

Galluzzi

1998

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

View full text Add to dashboard Cite

Performance improvement of polycrystalline diamond ultraviolet photodetectors by room-temperature plasma treatment Appl. Phys. Lett. 86, 093503 (2005); 10.1063/1.1868862 Effects of microwave power on the structural and emission properties of hydrogenated amorphous silicon carbide deposited by electron cyclotron resonance chemical vapor deposition Defect structure and electron field-emission properties of boron-doped diamond films

show abstract

“…If the film is stress-free, this peak is triply degenerate. The broad and low intensive peaks at higher wave numbers can be assigned to ordered and disordered graphite [14].…”

Section: Raman Spectroscopic Stress Determination In Diamondmentioning

confidence: 98%

Raman spectroscopic and X‐ray investigation of stressed states in diamond‐like carbon films

Krawietz¹,

Kämpfe

Auerswald

et al. 2004

Cryst. Res. Technol.

View full text Add to dashboard Cite

The non-destructive characterization of intrinsic stress is very important to evaluate the reliability of devices based on diamond-like carbon (DLC) films. Whereas the only requirement for the X-ray diffraction method is a crystalline state of specimen, Raman spectroscopic stress analysis is restricted to materials showing intensive and sharp Raman peaks. On the other hand, Raman spectroscopy offers the possibility to measure stress profiles with lateral resolution of about 1 micron. The results of stress measurements in DLC films using both X-ray diffraction and Raman spectroscopy are found in very good correspondence. Mean stress in carbon films consisting of very small crystallites on silicon substrates has been determined by measuring and fitting the stress profiles in the substrate near artificial vertical film edges.

show abstract

Direct imaging and confocal mapping of diamond films using luminescence and Raman scattering

Cited by 39 publications

References 16 publications

Surface-enhanced resonance Raman scattering imaging of Langmuir-Blodgett monolayers of bis(benzimidazo)perylene on silver island films

Surface-enhanced resonance Raman scattering imaging of Langmuir-Blodgett monolayers of bis(benzimidazo)perylene on silver island films

Defect structure, distribution, and dynamics in diamond-on-silicon optoelectronic devices

Raman spectroscopic and X‐ray investigation of stressed states in diamond‐like carbon films

Contact Info

Product

Resources

About