Conspectus
Cryogenic-temperature transmission electron microscopy (cryo-TEM)
of aqueous systems has become a widely used methodology, especially
in the study of biological systems and synthetic aqueous systems,
such as amphiphile and polymer solutions. Cryogenic-temperature scanning
electron microscopy (cryo-SEM), while not as widely used as cryo-TEM,
is also found in many laboratories of basic and applied research.
The application of these methodologies, referred to collectively as
cryogenic-temperature electron microscopy (cryo-EM) for direct nanostructural
studies of nonaqueous liquid systems is much more limited, although
such systems are important in basic research and are found in a very
large spectrum of commercial applications. The study of nonaqueous
liquid systems by cryo-EM poses many technical challenges. Specimen
preparation under controlled conditions of air saturation around the
specimen cannot be performed by the currently available commercial
system, and the most effective cryogen, freezing ethane, cannot be
used for most such liquid systems. Imaging is often complicated by
low micrograph contrast and high sensitivity of the specimens to the
electron beam.
At the beginning of this Account, we describe the basic principles
of cryo-EM, emphasizing factors that are essential for successful
direct imaging by cryo-TEM and cryo-SEM. We discuss the peculiarities
of nonaqueous liquid nanostructured systems when studied with these
methodologies and how the technical difficulties in imaging nonaqueous
systems, from oil-based to strong acid-based liquids, have been overcome,
and the applicability of cryo-TEM and cryo-SEM has been expanded in
recent years. Modern cryo-EM has been advanced by a number of instrumental
developments, which we describe. In the TEM, these include improved
electron field emission guns (FEGs) and microscope optics, the Volta
phase plate to enhance image contrast by converting phase differences
to amplitude differences without the loss of resolution by an objective
lens strong underfocus, and highly sensitive image cameras that allow
the recording of TEM images with minimal electron exposure. In the
SEM, we take advantage of improved FEGs that allow imaging at a low
(around 1 kV) electron acceleration voltage that is essential for
high-resolution imaging and for avoiding specimen charging of uncoated
nonconductive specimens, better optics, and a variety of sensitive
detectors that have considerably improved resolution and, under the
proper conditions, give excellent contrast even between elements quite
close on the periodic table of the elements, such as the most important
oxygen and carbon atoms.
Finally we present and analyze several examples from our recent
studies, which illustrate the issues presented above, including the
remarkable progress made in recent years in this field and the strength
and applicability of cryo-EM methodologies.