“…Recently, direct approaches have been developed by ENEA [133], [134] and by the University of Twente (UT) [113]. In this work the probe-station described in chapter 2, section 2.3 is used with four micro-point-contact needles serving as voltage 3.2 Intra wire resistance measurements tips and current leads, allowing for a standard four-point voltage-current (V-I) measurement to extract intra-wire resistance values, including filament-to-matrix resistance and matrix resistivity [113]. In sections 3.2 to 3.7, an overview is given of such data for a wide range of NbTi, Nb 3 Sn, MgB 2 and Bi-2212 wires, as well as Bi-2223 or YBCO tapes, collected at various temperatures and applied magnetic fields.…”