In this work, a new form of double Langmuir probe system, an Emissive Double Langmuir probe (EDLP), which connects a collecting probe tip and an electron emitting probe tip to form a double Langmuir probe system, has been proposed as a replacement of the currently more common asymmetric double Langmuir probes (ADLP). The EDLP was both computationally and experimentally investigated in this work. Using an emissive probe to provide an emission current IE to balance the electron collection current IC,e, the EDLP can obtain a full I-V trace when IE,TL > IC,es and be used in a similar manner with a single Langmuir probe except the EDLP, as with the ADLP, does not measure the local plasma potential. IE,TL >> IC,es can be realized on an EDLP without needing the much larger ion collection area required by the ADLP, and at IE,TL ~ 2IC,es the relative error between the EDLP and a single Langmuir probe is ~15% due to SCL effects, which is better than that of the ADLP at ~30% under similar conditions. The performance of an EDLP depends on whether its electron emission current sufficiently offsets its electron collecting current, making it particularly fitted for scenarios where plasma density is low but a large probe is difficult to employ due to limited balancing ion current. This makes the EDLP potentially useful on satellites which operates in very low temperature plasmas with a limited ion loss area to balance a Langmuir probe’s electron collecting current. With the advances of highly emitting materials, EDLPs are expected to significantly remove design barriers of Langmuir probes on satellites.