2001
DOI: 10.1557/jmr.2001.0207
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Direct measurement of plowing friction and wear of a polymer thin film using the atomic force microscope

Abstract: Nanometer-scale plowing friction and wear of a polycarbonate thin film were directly measured using an atomic force microscope (AFM) with nanoscratching capabilities. During the nanoscratch tests, lateral forces caused discrepancies between the maximum forces for the initial loading prior to the scratch and the unloading after the scratch. In the case of a nanoscratch test performed parallel to the cantilever probe axis, the plowing friction added another component to the moment acting at the cantilevered end … Show more

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Cited by 36 publications
(17 citation statements)
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“…The scratch test has potential for use with ultra-thin [66] and composite-layered surfaces. At present, this test has been applied to coatings and thin films where specific energy to initiate cracking is used as a key parameter.…”
Section: Concluding Discussion and Final Remarksmentioning
confidence: 99%
“…The scratch test has potential for use with ultra-thin [66] and composite-layered surfaces. At present, this test has been applied to coatings and thin films where specific energy to initiate cracking is used as a key parameter.…”
Section: Concluding Discussion and Final Remarksmentioning
confidence: 99%
“…Microscale tribological and mechanical material properties such as surface roughness, wear, friction, elastic modulus, and boundary lubrication have been studied on engineering and biological surfaces by AFM (Bhushan and Koinkar, 1996;Du et al, 2001). However, the tribological and mechanical material properties of articular cartilage have not yet been well characterized at microscale levels, neither have the relationships between microscale properties or between micro-and macroscale properties.…”
Section: Introductionmentioning
confidence: 99%
“…[28][29][30][31] Scanning probe microscopy instruments, such as the atomic force microscope, [32][33][34] have also been adopted and improvised by researchers to perform scratch tests at a nanometer scale. For evaluating the scratch surface and subsurface, researchers have used equipment like the optical microscope (OM), 18,24,26 atomic force microscope, 24,26,32,[35][36][37][38] scanning electron microscope, 14,15,26,39,40 X-ray photoelectron spectroscope, 41 laser confocal microscope, 18 Raman spectroscope, 28 white-light interferometer, 20,24 profilometer, 14,15,42 tribometer, 43 ellipsometer, 28 and scanner. 17,44,45 A review of the scratch test devices available for macroscopic testing 46 readily reveals that the ranges of normal loads and scratch rates for most devices are rather limited, while some of them may only be good for the evaluation of marred surfaces and, thus, insufficient for the scratch studies.…”
mentioning
confidence: 99%