“…[28][29][30][31] Scanning probe microscopy instruments, such as the atomic force microscope, [32][33][34] have also been adopted and improvised by researchers to perform scratch tests at a nanometer scale. For evaluating the scratch surface and subsurface, researchers have used equipment like the optical microscope (OM), 18,24,26 atomic force microscope, 24,26,32,[35][36][37][38] scanning electron microscope, 14,15,26,39,40 X-ray photoelectron spectroscope, 41 laser confocal microscope, 18 Raman spectroscope, 28 white-light interferometer, 20,24 profilometer, 14,15,42 tribometer, 43 ellipsometer, 28 and scanner. 17,44,45 A review of the scratch test devices available for macroscopic testing 46 readily reveals that the ranges of normal loads and scratch rates for most devices are rather limited, while some of them may only be good for the evaluation of marred surfaces and, thus, insufficient for the scratch studies.…”