Direct Measurement of Refractive Index Profiles of Ti:LINBO3 Planar and Stripe Waveguides by Reflectivity Profiling

Abstract

The reflectivity measurement of angular polished surfaces of Ti:LiNbO3 waveguides is utilized to determine directly the refractive index profiles of planar and stripe waveguides with an accuracy of Δn/n = 10-4 and a local resolution of <0.1 μm in depth and <1 μm in width.