1997
DOI: 10.1021/la9610967
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Direct Measurement of Repulsive and Attractive van der Waals Forces between Inorganic Materials

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Cited by 114 publications
(43 citation statements)
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“…Repulsion occurs when the plates with dielectric permittivities ε 1 and ε 2 along the imaginary frequency axis are immersed inside a medium with the dielectric permittivity ε 0 such that ε 1 < ε 0 < ε 2 or ε 2 < ε 0 < ε 1 (Mahanty, Ninham, 1976). At short separations in the nonretarded van der Waals regime this effect has been discussed for a long time and measurements have been reported [see, e.g., review by Visser (1981) and one of the later experiments by Meurk et al (1997)]. At separations of about 30 nm the same effect was measured by Munday et al (2009).…”
Section: Pulsating Casimir Forcementioning
confidence: 61%
“…Repulsion occurs when the plates with dielectric permittivities ε 1 and ε 2 along the imaginary frequency axis are immersed inside a medium with the dielectric permittivity ε 0 such that ε 1 < ε 0 < ε 2 or ε 2 < ε 0 < ε 1 (Mahanty, Ninham, 1976). At short separations in the nonretarded van der Waals regime this effect has been discussed for a long time and measurements have been reported [see, e.g., review by Visser (1981) and one of the later experiments by Meurk et al (1997)]. At separations of about 30 nm the same effect was measured by Munday et al (2009).…”
Section: Pulsating Casimir Forcementioning
confidence: 61%
“…In Refs. [31][32][33][34][35][36] QED Casimir repulsion has indeed been observed experimentally for the sphere-plate geometry. In order to minimize the potential negative effects of all possible circuitry at such a small distances and the complications with the isolation, as well as possible problems involving chemical reactions it seems that one promising strategy for overcoming the obstacles mentioned above is to choose such a fluid as a medium that possesses no free changes dissolved in it and that is inert and do not interact chemically with the materials.…”
Section: Introductionmentioning
confidence: 93%
“…Since the development of the atomic force microscope (AFM) by Binnig et al (1), it has become possible to measure forces between a sharp tip and a flat surface of a specific material, whether in air (2) or liquids (3,4). Recent advances allowed the use of metallic (5) or inorganic (6) spheres as tip.…”
Section: Introductionmentioning
confidence: 99%