“…In addition to the investigation of the electronic structure of point defects or impurities (Perraud et al, 2008;Wijnheijmer et al, 2009) and the carrier dynamics between their bound states and the semiconductor bands, STM also provides access to the charge state of the defect as a function of the sample voltage. For example, the Si dangling bond, which corresponds to a nonbonded sp 3 -hybrid orbital, pointing outward of the surface, is known to exist in different charge states.…”