2013
DOI: 10.1364/ol.38.001563
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Direct measurement of the x-ray refractive index by Fresnel diffraction at a transparent edge

Abstract: We demonstrate the feasibility of measuring x-ray refractive indices by transparent edge diffraction without recourse to the Kramers-Kronig relations. The method requires a coherent x-ray source, a transparent sample with a straight edge, and a high resolution x-ray detector. Here, we use the aluminum Kα radiation originating from a laser-produced plasma to coherently illuminate the edge of thin aluminum and beryllium foils. The resulting diffraction patterns are recorded with an x-ray CCD camera. From least-s… Show more

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Cited by 19 publications
(9 citation statements)
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“…the shapes of the diffraction peaks, was found to be particularly sensitive to the phase shift of the light passing through the sample. This behaviour was also exploited by Gayer et al to measure the real refractive index of K α radiation by measuring the Fresnel diffraction from a knife edge [25].…”
Section: Data Analysis and Resultsmentioning
confidence: 99%
“…the shapes of the diffraction peaks, was found to be particularly sensitive to the phase shift of the light passing through the sample. This behaviour was also exploited by Gayer et al to measure the real refractive index of K α radiation by measuring the Fresnel diffraction from a knife edge [25].…”
Section: Data Analysis and Resultsmentioning
confidence: 99%
“…Similarly to the spatial case, we can indeed consider the impact of a temporal phase shift imprinted on an initial pulse [23,61,62], on a wave that has an initial chirp [63,64] or a wave that is only partially coherent [3]. With the progress of coherent transmissions, it is also possible to combine intensity and phase modulation, therefore mimicking a partially transparent phase object [22,48,65]. Moreover, it is possible to benefit from the vectorial properties of light in fibers to explore new degrees of freedom and other nonlinear structures [66].…”
Section: Discussionmentioning
confidence: 99%
“…Finally, we should mention that the researchers have applied the Fresnel diffraction from a phase step to the measurements of the refractive index in X-ray region [23], film thickness [24][25][26], etching rate [27], simultaneous measurement of film thickness and refractive index [26], focal lengths of the lenses [28], specification of the spectral line profile [29], and modulation of phase function [30], Applications are increasing, particularly, in quantitative imaging of the phase objects in different scales [13,[31][32].…”
Section: Measurement Of Diffusion Coefficientmentioning
confidence: 99%