2014
DOI: 10.1063/1.4889803
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Direct observation of intrinsic piezoelectricity of Pb(Zr,Ti)O3 by time-resolved x-ray diffraction measurement using single-crystalline films

Abstract: Lead zirconate titanate, Pb(Zr,Ti)O3 or PZT, is one of the most widely investigated ferroelectric and piezoelectric materials due to its superior properties. However, the intrinsic properties of PZT have not been directly measured due to the lack of fabrication of single crystals even though a basic understanding of intrinsic properties has been of interest developing lead-free piezoelectric materials. We demonstrated the direct observation of the intrinsic piezoelectric property by means of the detection of e… Show more

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Cited by 26 publications
(22 citation statements)
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“…The MAPbI3 peak shift is more prominent than previously reported piezoelectric response of ferroelectric inorganic perovskites. [ 37,38 ] The diffraction measurements clearly indicate that MAPbI 3 is under strong lattice strain originating from E-fi eld and charge accumulation.…”
Section: Resultsmentioning
confidence: 97%
“…The MAPbI3 peak shift is more prominent than previously reported piezoelectric response of ferroelectric inorganic perovskites. [ 37,38 ] The diffraction measurements clearly indicate that MAPbI 3 is under strong lattice strain originating from E-fi eld and charge accumulation.…”
Section: Resultsmentioning
confidence: 97%
“…The strain of PZT films is largely clamped by the stiff, large volume, underlying substrate and the PZT with single polar‐axis orientation can't create two stable and distinct remnant strain states, resulting negligible remnant strain, so the strain effects can also be ruled out. [ 29–30 ] These results indicate that the magnetic properties are mainly modulated by the ferroelectric polarization along the out‐of‐plane direction.…”
Section: Resultsmentioning
confidence: 92%
“…Many methods have been developed to obtain the internal characteristics of a material, including transmission electron microscopy (Pachauri et al, 2015;Sudheer et al, 2015), scanning electron microscopy (Må rsell et al, 2015), X-ray photoelectron spectroscopy (Anasori et al, 2015), small-angle X-ray scattering (Kasyutich et al, 2009), hyperspectral transmission (Jacques et al, 2013), X-ray fluorescence (Mainz & Klenk, 2011;Bu et al, 2011;Abuillan et al, 2012;Guerra et al, 2014;Pandey & Mukamel, 2006), coherent diffractive imaging (Johnson et al, 2008), phase contrast (Sarapata et al, 2015), inelastic scatter (Huotari et al, 2011) and X-ray diffraction (Voltolini et al, 2013;Nolf et al, 2014;Navirian et al, 2014). Among these techniques, X-ray diffraction (XRD), which is based on coherent scattering of photons from an incident X-ray beam by atoms in a material, plays an important role in structural studies because it is commonly utilized for material characterization (Likhacheva et al, 2014;Ferrari et al, 1996;Gutt et al, 2014;Shen et al, 2015;Hirai et al, 2015;Hé doux et al, 2013;Fujisawa et al, 2014;Bjeoumikhov et al, 2005). As is well known, XRD has two modes: angular-dispersive X-ray diffraction (ADXRD) and energy-dispersive X-ray diffraction (EDXRD).…”
Section: Introductionmentioning
confidence: 99%