“…Many methods have been developed to obtain the internal characteristics of a material, including transmission electron microscopy (Pachauri et al, 2015;Sudheer et al, 2015), scanning electron microscopy (Må rsell et al, 2015), X-ray photoelectron spectroscopy (Anasori et al, 2015), small-angle X-ray scattering (Kasyutich et al, 2009), hyperspectral transmission (Jacques et al, 2013), X-ray fluorescence (Mainz & Klenk, 2011;Bu et al, 2011;Abuillan et al, 2012;Guerra et al, 2014;Pandey & Mukamel, 2006), coherent diffractive imaging (Johnson et al, 2008), phase contrast (Sarapata et al, 2015), inelastic scatter (Huotari et al, 2011) and X-ray diffraction (Voltolini et al, 2013;Nolf et al, 2014;Navirian et al, 2014). Among these techniques, X-ray diffraction (XRD), which is based on coherent scattering of photons from an incident X-ray beam by atoms in a material, plays an important role in structural studies because it is commonly utilized for material characterization (Likhacheva et al, 2014;Ferrari et al, 1996;Gutt et al, 2014;Shen et al, 2015;Hirai et al, 2015;Hé doux et al, 2013;Fujisawa et al, 2014;Bjeoumikhov et al, 2005). As is well known, XRD has two modes: angular-dispersive X-ray diffraction (ADXRD) and energy-dispersive X-ray diffraction (EDXRD).…”