2016
DOI: 10.1016/j.nanoen.2015.11.003
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Direct probing Se spatial distribution in Cu(In Ga1−)Se2 solar cells: A key factor to achieve high efficiency performance

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Cited by 17 publications
(14 citation statements)
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“…The effective doping concentration, N CV , extracted from this curve was 5.53 × 10 15 /cm 3 , which falls within a similar range to the values reported for the most efficient devices . In the Se‐deficient CIGS absorber layer, deep level defects with activation energies of 300 meV or more are generated, which reduces the minority carrier lifetime or causes severe J‐V curve distortion, such as roll‐over . Furthermore, a post‐heat treatment for the supply of alkali elements or an additional selenization heat treatment at a low temperature of 400°C or lower must be applied to remove the roll‐over and passivate the deep level defects .…”
Section: Resultssupporting
confidence: 75%
See 1 more Smart Citation
“…The effective doping concentration, N CV , extracted from this curve was 5.53 × 10 15 /cm 3 , which falls within a similar range to the values reported for the most efficient devices . In the Se‐deficient CIGS absorber layer, deep level defects with activation energies of 300 meV or more are generated, which reduces the minority carrier lifetime or causes severe J‐V curve distortion, such as roll‐over . Furthermore, a post‐heat treatment for the supply of alkali elements or an additional selenization heat treatment at a low temperature of 400°C or lower must be applied to remove the roll‐over and passivate the deep level defects .…”
Section: Resultssupporting
confidence: 75%
“…In the Se‐deficient CIGS absorber layer, deep level defects with activation energies of 300 meV or more are generated, which reduces the minority carrier lifetime or causes severe J‐V curve distortion, such as roll‐over . Furthermore, a post‐heat treatment for the supply of alkali elements or an additional selenization heat treatment at a low temperature of 400°C or lower must be applied to remove the roll‐over and passivate the deep level defects . In contrast to the process complexity described earlier, the NFS used in this study for the synthesis of Se sufficient CIGS is a simple process and provides a new Se vapor‐based process technology that can replace the H 2 Se‐based selenization process.…”
Section: Resultsmentioning
confidence: 99%
“…This is quite different from coevaporation or postselenization processes. A deficient supply of Se results in the formation of V Se and In Cu donor defects in CIGS thin films, which is detrimental to cell performance . To overcome these issues with Se deficiency, additional supply of Se through postselenization in either a Se or H 2 Se atmosphere is usually required .…”
Section: Introductionmentioning
confidence: 99%
“…Figure a shows an example of minority carrier lifetime measurements using TRPL with a pulsed laser at a wavelength of 638 nm. [ 99 ] TRPL signals for postselenization‐treated CIGS films at different temperatures are measured. The decay characteristics for the PL intensity are presented in Figure 9a, and the minority carrier lifetime for each sample is derived from the curves.…”
Section: Characterization Of the Electrical Properties Of A Devicementioning
confidence: 99%