The field of XPS imaging and spectromicroscopy has recently made significant progress thanks to laboratory X-ray photoelectron emission microscopy (XPEEM), a novel, versatile parallel imaging method for which lateral resolution of core-level images in the 500 nm range, and spectromicroscopy from decanometric-size area of interest have been demonstrated (J. Electron Spectroc. Relat. Phenom. 171 (2009), 68). It uses a bright microfocussed monochromated Al Kα source and a photoelectron emission microscope (PEEM) as entrance lens of a high-transmission, aberration-compensated imaging spectrometer in the form of a double hemispherical analyzer. In this paper, restricted to laboratory aspects of XPS spectromicroscopy, we will first give some details of this novel instrumentation after a short historical review of the field until the presently existing imaging techniques. Then, some of the first results of laboratory core-level XPEEM on practical samples will be presented. Future perspectives towards quantitative analysis, improvements of lateral resolution and multitechnique spectromicroscopic aspects with laboratory sources (including UPS spectromicroscopy in direct and reciprocal space) will be drawn.