2022
DOI: 10.1021/acsapm.2c01632
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Direct Quantitative Characterization of Polymer Brushes Obtained by Surface-Initiated ATRP on Silicon

Abstract: With respect to the increasing need for fully characterizing surface-tethered polymer brushes, the capacity of quantitative IR-Fourier transform infrared (FTIR) spectroscopy using a multiple-internal-reflection Si prism as the attenuated total reflection (ATR) element is investigated to directly characterize the surface chemical modifications occurring during a surface-initiated controlled polymerization. A simple two-step strategy is used involving first the covalent grafting of atom transfer radical polymeri… Show more

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Cited by 5 publications
(3 citation statements)
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“…Based on these XPS results and the molecular size of organosilanes used, the maximum concentration of SIs within the SILs was estimated to be about 3 units/nm 2 from the atomic ratios (Table S6). This value was smaller than that of surface silanol (Si–OH) groups on the oxidized Si substrates (∼5 units/nm 2 ) and was in good agreement with previously reported values for the SAM-based SILs (3–4 units/nm 2 ) . Furthermore, the experimental SI concentration at DF of 10 (4.1 × 10 –1 units/nm 2 ) was in good agreement with that of the theoretical one (3.9 × 10 –1 units/nm 2 ) (Table S6).…”
Section: Resultssupporting
confidence: 91%
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“…Based on these XPS results and the molecular size of organosilanes used, the maximum concentration of SIs within the SILs was estimated to be about 3 units/nm 2 from the atomic ratios (Table S6). This value was smaller than that of surface silanol (Si–OH) groups on the oxidized Si substrates (∼5 units/nm 2 ) and was in good agreement with previously reported values for the SAM-based SILs (3–4 units/nm 2 ) . Furthermore, the experimental SI concentration at DF of 10 (4.1 × 10 –1 units/nm 2 ) was in good agreement with that of the theoretical one (3.9 × 10 –1 units/nm 2 ) (Table S6).…”
Section: Resultssupporting
confidence: 91%
“…This value was smaller than that of surface silanol (Si−OH) groups on the oxidized Si substrates (∼5 units/nm 2 ) 62 and was in good agreement with previously reported values for the SAM-based SILs (3−4 units/nm 2 ). 63 Furthermore, the experimental SI concentration at DF of 10 (4.1 × 10 −1 units/nm 2 ) was in good agreement with that of the theoretical one (3.9 × 10 −1 units/nm 2 ) (Table S6). Thus, our present results are concluded to be reasonable.…”
Section: ■ Results and Discussionsupporting
confidence: 82%
“…ATRP is typically performed in anaerobic environments because propagating radicals react with oxygen to form stable peroxy radicals and hydroperoxides, thus quenching chain growth. [20][21][22] Moreover, some ATRP methods use low-valence transition metal (such as Cu(I), Fe(II) and Ni(II)) complexes as catalysts, which are sensitive to O 2 . 23 Freeze-pump-thaw cycles, purging with inert gas, and working in a glovebox or Schlenk tube are the commonly used techniques to overcome the effect of oxygen for ATRP systems.…”
Section: Introductionmentioning
confidence: 99%