Direct solid sample analysis using furnace vaporization with Freon modification and inductively coupled plasma atomic emission spectrometry—II. Analysis of real samples

Ren, J. M.; Salin, Eric D.

doi:10.1016/0584-8547(94)80049-9

Cited by 26 publications

(8 citation statements)

References 10 publications

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“…Therefore if it is intended to define the "sample carrier gas" (see, e.g. [4,11]), one should consider with the present system three components of the total carrier gas. In addition to the internal and external furnace gases which serve also as carrier gases, the third component (which is the major one in the present system) may be called "auxiliary carrier gas".…”

Section: Methodsmentioning

confidence: 99%

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Optimization of the electrothermal vaporization conditions for inductively coupled plasma excitation spectrometry: Selective volatilization versus covolatilization approaches

Kántor

1996

Analytical and Bioanalytical Chemistry

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A new version of the outlet port of a graphite furnace electrothermal vaporizer (upward streaming system) is described, in which the hot sample vapour is mixed with an auxiliary carrier argon stream of ambient temperature. The operation procedures using carrier volatilization of organic liquids as gas phase additives are also outlined. The selective volatilization and transport efficiency for As, Cd, Hg, Pb, Sb, Se and Zn could be increased by applying sodium thiosulfate as chemical modifier to solution samples with controlled nitric acid content. On the other hand, a near simultaneous vaporization of 16 elements using chlorination with CCl(4) vapour at 2100 degrees C could be performed for a multielement analysis. By wetting the auxiliary carrier argon stream, the linearity of the analytical curves was improved (except for chromium), when applying multielement standards. Linear analytical curves could also be obtained in the presence of alkali and alkaline earth metal matrices in multielement standards using halocarbon assisted electrothermal vaporization sample introduction.

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Section: Methodsmentioning

confidence: 99%

“…Powder samples have been applied into the furnace as slurry [11], in form of pellet [12] and by means of different sample handling devices [13][14][15][16][17][18]. The present paper is restricted to the analysis of solution samples, either applied to the graphite tube wall, or into a graphite sample boat.…”

Section: Introductionmentioning

confidence: 99%

Optimization of the electrothermal vaporization conditions for inductively coupled plasma excitation spectrometry: Selective volatilization versus covolatilization approaches

Kántor

1996

Analytical and Bioanalytical Chemistry

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“…35,36 An addition of HNO 3 or O 2 allows the removal of the matrix at lower temperatures. 39,40 Mostly, reactive halocarbons are added to the transport gas stream. 38 Particles formed by pyrolysis of the modier can also act as condensation nuclei for sample vapours, which have a positive effect on transport efficiency.…”

Section: Introductionmentioning

confidence: 99%

Direct multi-element analysis of plastic materials via solid sampling electrothermal vaporization inductively coupled plasma optical emission spectroscopy

Börno

Richter

Deiting

et al. 2015

J. Anal. At. Spectrom.

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In this work the determination of Cd, Cu, Cr, Fe and Sb as organic and inorganic additives in in-house plastic materials (ABS, LDPE) using electrothermal vaporization combined with inductively coupled plasma optical emission spectroscopy is described. The influence of CCl 2 F 2 as gaseous halogenation modifier was investigated. Especially for the carbide forming elements the sensitivity was improved and the memory effects were significantly reduced. Calibration was performed by external calibration and standard addition with aqueous standard solutions added directly into the sample boats. Absolute limits of detection (3s-criterion) range between 0.1 ng (Cd) and 9 ng (Fe) which corresponds to relative values of 0.1 mg kg À1 and 1.6 mg kg À1 , respectively, taking 5 mg as typical sample mass. The detection limits are sufficient to monitor the element contents of plastic materials according to European directives such as European directive on the safety of toys. The developed ETV-ICP-OES method allows a fast analysis with a high sample throughput (3 minutes per analysis), low sample consumption and good trueness and precision for the analyzed elements. Sample preparation is reduced to ashing the samples in a muffle furnace. Furthermore, measurements are possible regardless of the chemical form in the additives. For verification the results obtained with the developed method were compared with measurement results of independent methods ICP-MS/OES after digestion. In addition Cd, Cr and Pb were determined in a solid plastic reference material BAM-H010 to confirm the applicability and accuracy of the method.

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“…Kirkbright and Snook 12 used 0.1% freon-23 for the determination of B, Mo, Zr, Cr and W, 13 and CCl 2 and freon-12 to determine trace elements in ceramic powders and SiC. 14 Ren and Salin 15,16 and Allary et al 17 used freon-12 to enhance the vaporization of carbide forming elements. Matousek et al 18 used Cl 2 for the determination of Cr, V, Ti, W, and Zr.…”

Section: Introductionmentioning

confidence: 99%

Vaporization and removal of silica for the direct analysis of geological materials by slurry sampling electrothermal vaporization-inductively coupled plasma-mass spectrometry

Younes¹,

Grégoire²,

Chakrabarti³

1999

J. Anal. At. Spectrom.

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Reported is a method for the removal of silica for the direct analysis of solid geological samples high in silica content using slurry sampling electrothermal vaporization-inductively coupled plasma-mass spectrometry (ETV-ICP-MS). The ETV-ICP-MS vaporization curve for SiO 2 , sampled as a slurry, is reported for temperatures ranging from 810±2600 ³C. This curve showed that silica was completely vaporized at a temperature of 2200 ³C. The effect of using HF as a chemical modi®er to remove silica as the tetra¯uoride was studied. It was found that HF could completely remove any Si attributed to silica if suf®cient modi®er were added and an adequate reaction time allowed. At reaction hold times that were less than optimal, two Si signals were observed. The ®rst signal, which appears at an earlier time and at a temperature less than 480 ³C, is attributed to the volatilization of silicon tetra¯uoride. The second signal, which appears at a later time and at a temperature of about 2500 ³C, is attributed to the vaporization of residual unreacted SiO 2 remaining in the graphite tube, or to the vaporization of a mixture of SiO 2 and SiC. 20 ml of 50% HF is effective in completely removing 0.125 mg of SiO 2 . No adverse effects including corrosive degradation of the graphite tube were observed over the lifetime of the tube, which exceeded 200 ®rings. Hydro¯uoric acid chemical modi®er was successful in removing virtually all the silica content in natural silicate standard reference materials.

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Direct solid sample analysis using furnace vaporization with Freon modification and inductively coupled plasma atomic emission spectrometry—II. Analysis of real samples

Cited by 26 publications

References 10 publications

Optimization of the electrothermal vaporization conditions for inductively coupled plasma excitation spectrometry: Selective volatilization versus covolatilization approaches

Optimization of the electrothermal vaporization conditions for inductively coupled plasma excitation spectrometry: Selective volatilization versus covolatilization approaches

Direct multi-element analysis of plastic materials via solid sampling electrothermal vaporization inductively coupled plasma optical emission spectroscopy

Vaporization and removal of silica for the direct analysis of geological materials by slurry sampling electrothermal vaporization-inductively coupled plasma-mass spectrometry

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