Directional effects of heavy-ion irradiation in Tb/Fe multilayers

Juraszek, J.; Fnidiki, A.; Teillet, J.; Toulemonde, M.; Michel, A.; Keune, W.

doi:10.1103/physrevb.61.12

Cited by 248 publications

(6 citation statements)

References 15 publications

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“…Recently, in an interesting experiment, Juraszek et al have studied a possible directional effect of swift heavy ion irradiation in Tb/ Fe multilayers by irradiating two identical multilayers kept face to face with each other, thus making the Pb ions traverse the two multilayers in opposite directions ͑i.e., Tb to Fe and Fe to Tb͒. 29 Sensitivity to Fe-on-Tb interface was achieved by depositing a 0.5 nm thick 57 Fe marker layer at the interface, and using conversion electron Mössbauer spectroscopy to detect the changes at the interface. It was concluded that intermixing at the Fe/ Tb interface is not affected by the direction in which 11.…”

Section: Resultsmentioning

confidence: 99%

Depth profiling of marker layers using x-ray waveguide structures

et al. 2005

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It is demonstrated that x-ray waveguide structures can be used for depth profiling of a marker layer inside the guiding layer with an accuracy of better than 0.2 nm. A combination of x-ray fluorescence and x-ray reflectivity measurements can provide detailed information about the structure of the guiding layer. The position and thickness of the marker layer affect different aspects of the angle-dependent x-ray fluorescence pattern, thus making it possible to determine the structure of the marker layer in an unambiguous manner. As an example, effects of swift heavy ion irradiation on a Si/ M / Si trilayer ͑M = Fe, W͒, forming the cavity of the waveguide structure, have been studied. It is found that in accordance with the prediction of thermal spike model, Fe is much more sensitive to swift heavy ion induced modifications as compared to W, even in thin film form. However, a clear evidence of movement of the Fe marker layer towards the surface is observed after irradiation, which cannot be understood in terms of the thermal spike model alone.

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Section: Resultsmentioning

confidence: 99%

Depth profiling of marker layers using x-ray waveguide structures

et al. 2005

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“…No change in the average composition of the mixed Tb/Fe interface was observed when the incident ion direction is changed from a Tb layer to a Fe layer or vice versa. The authors suggested that the basic mechanism which allows converting the energy transferred to the electronic subsystem into atomic motion leading to interfacial mixing is independent of the relative position of the different layers with respect to the incident beam direction [559].…”

Section: Metal/metalmentioning

confidence: 99%

Ion beam induced surface and interface engineering

Jain

Agarwal

2011

Surface Science Reports

261

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“…Inside this tracks, amorphization of crystalline material may be induced. Several transformations in magnetic materials have been reported such as increase of coercivity by domain wall pinning in permanent magnet [3] or atomic mixing at the interfaces in magnetic Fe/Tb multilayers [4].…”

Section: Introductionmentioning

confidence: 99%