Controlling
thickness and morphology of transition-metal thin films
used in magnetic random-access memory fabrication is a major challenge.
Thermal dry etching has emerged as a method of choice for preparing
the desired films; however, the mechanisms of the underlying surface
processes are very difficult to assess. In this work, thermal dry
etching of metallic iron by using sequential exposure to chlorine
gas and 2,4-pentanedione (acetylacetone, acacH) was investigated.
The mechanism of reacting acacH with chlorine-modified iron surface
was studied by following the fragments desorbing from the surface
in temperature-programmed desorption experiments in half-cycle processes
that compared the chlorinated, oxidized, mixed (Cl and O), and clean
(sputtered) iron films. In situ Auger electron spectroscopy and ex
situ X-ray photoelectron spectroscopy of each sample after each etching
step confirmed that the surface is activated by chlorine and then
the chlorine-containing iron species are removed from the top layer
of the sample, resulting in a metallic iron surface. No etching of
clean (sputtered) surface was observed with acacH. The complete mechanism
of acacH reaction with chlorinated iron samples is complicated, and
etch products can contain both Fe2+ and Fe3+. However, a number of major conclusions, including the formation
of surface intermediates and the final products of etching, primarily
removal of Fe(acac)
x
Cl
y
, are inferred by comparing the results of these experiments
with the computational investigation of selected surface processes
using density functional theory calculations.