Divalent stannous oxide, oxide semiconductor, p-type, oxygen vacancy, EXAFS, Rietveld analysis ABSTRACT: Divalent tin oxides have attracted considerable attention as novel p-type oxide semiconductors, which are essential for realizing future oxide electronic devices. Recently, p-type Sn 2 Nb 2 O 7 and SnNb 2 O 6 were developed; however, enhanced hole mobility by reducing defect concentrations is required for practical use. In this work, we investigate the correlation between the formation of oxygen vacancy (V ! •• ), which may reduce the hole-generation efficiency and hole mobility, and the crystal structure in Sn-Nb complex oxides. Extended X-ray absorption fine structure spectroscopy and Rietveld analysis of x-ray diffraction revealed the preferential formation of V ! •• at the O site bonded to the Sn ions in both the tin niobates. Moreover, a large amount of V ! •• around the Sn ions were found in the p-type Sn 2 Nb 2 O 7 , thereby indicating the effect of V ! •• to the low holegeneration efficiency. The dependence of the formation of V ! •• on the crystal structure can be elucidated from the Sn-O bond strength that is evaluated based on the bond valence sum and Debye temperature. The differences in the bond strengths of the two Sn-Nb complex oxides are correlated through the steric hindrance of Sn 2+ with asymmetric electron density distribution. This suggests the importance of the material design with a focus on the local structure around the Sn ions to prevent the formation of V ! •• in p-type Sn 2+ oxides.