“…Although some lithic use‐wear research has focused on various techniques that rely on two‐dimensional image analysis of worn stone tool surfaces, such as work by Barceló and Pijoan‐López (), Pijoan et al (), Barceló et al (), Dumont (), Gonzalez‐Urquijo and Ibañez‐Estevez (), Grace et al (), and Vila and Gallart (), among others, there has been recent interest in the application of methods that rely on documentation of surface roughness or texture using metrology, specifically laser profilometry (Stemp et al , , , ; see Stemp and Stemp, , ), atomic force microscopy (AFM) (Kimball et al , , ; Faulks et al , ), laser scanning confocal microscopy (LSCM) (Evans and Donahue, ; Evans and MacDonald, ; Stemp and Chung, ; Stevens et al , ), optical interferometry (Anderson et al , , ), and differential contrast microscopy (e.g., Alicona Infinite Focus) (Evans and MacDonald, ). Advantages associated with metrological study of stone surfaces include the production of data in three‐dimensions and the micro‐ to nanoscale level of surface measurement possible.…”