Access and use of this website and the material on it are subject to the Terms and Conditions set forth at
NRC Publications Record / Notice d'Archives des publications de CNRC:http://nparc.cisti-icist.nrc-cnrc.gc.ca/npsi/ctrl?action=rtdoc&an=21276883&lang=en http://nparc.cisti-icist.nrc-cnrc.gc.ca/npsi/ctrl?action=rtdoc&an=21276883&lang=fr READ THESE TERMS AND CONDITIONS CAREFULLY BEFORE USING THIS WEBSITE.http://nparc.cisti-icist.nrc-cnrc.gc.ca/npsi/jsp/nparc_cp.jsp?lang=en Vous avez des questions? Nous pouvons vous aider. Pour communiquer directement avec un auteur, consultez la première page de la revue dans laquelle son article a été publié afin de trouver ses coordonnées. Si vous n'arrivez pas à les repérer, communiquez avec nous à PublicationsArchive-ArchivesPublications@nrc-cnrc.gc.ca.
Questions? Contact the NRC Publications Archive team atPublicationsArchive-ArchivesPublications@nrc-cnrc.gc.ca. If you wish to email the authors directly, please see the first page of the publication for their contact information.
NRC Publications Archive Archives des publications du CNRCThis publication could be one of several versions: author's original, accepted manuscript or the publisher's version. / La version de cette publication peut être l'une des suivantes : la version prépublication de l'auteur, la version acceptée du manuscrit ou la version de l'éditeur. For the publisher's version, please access the DOI link below./ Pour consulter la version de l'éditeur, utilisez le lien DOI ci-dessous.http://doi.org/10.1016/S1359-6454(99) Acta Materialia, 47, 12, pp. 3383-3394, 1999-09-29 AbstractÐThe strain relaxation of a series of In 0.25 Ga 0.75 As ®lms grown on (100) InP substrates (lattice mismatch=2%) has been studied by electron microscopy. The mechanisms of strain relief (in the ®rst stages of growth) occurred by cracking on 0 11 , and by twinning on (111) and 111 planes. Cracking was a transitory process with the density of cracks being highest in a 20 nm thick ®lm, while a 500 nm thick ®lm was crack-free. These results are discussed in the context of di erent cracking and crack-healing models. #