Dislocations and substructure in large 0° Czochralski sapphire crystals

Belt, Roger F.; Puttbach, Richard C.

doi:10.1016/0025-5408(69)90083-x

Cited by 7 publications

(5 citation statements)

References 7 publications

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“…The perfection is so high that we have observed dislocations with predominant dynamical contrast. These results are consistent with the earlier w o r k that Czochralski-and flame fusion-grown crystals are not very perfect (8,9,(15)(16)(17)(18)29). In fact, in a study on growth of niobium films on sapphire crystals ( 30) it has been shown that CVD-grown crystals have much better perfection as compared to perfection of Czochralski-and V e r n e u i l -g r o w n sapphire crystals.…”

Section: Study Of Crystal Perfection Of Czochralski-grown Crystalssupporting

confidence: 92%

“…However, by suitably tilting the crystal this portion can be made to diffract. These results are s i m i l a r to those reported earlier (8,15,16). Some details of this aspect are reported elsewhere (29).…”

Section: Study Of Crystal Perfection Of Czochralski-grown Crystalssupporting

confidence: 88%

“…As mentioned earlier, in order to compare the p e rfection of CVD-grown crystals with that of the crystals grown by other techniques we chose Czochralskigrown crystals. Perfection of Czochralski-grown crystals has been studied earlier (8,9,17,18). Czochralskigrown wafers that we have investigated were in general not as perfect as CVD-grown crystals of type B.…”

Section: Study Of Crystal Perfection Of Czochralski-grown Crystalsmentioning

confidence: 89%

“…The flame-fusion method (1, 2), Czochralski method (2,3), flux method (1-3), growth from the vapor phase (1,3), chemical vapor deposition (CVD) (4), gradient furnace technique (5), and edge-defined film-fed growth (6) are the principal techniques for the growth of these crystals. Detailed investigations of perfection of crystals grown by a n u m b e r of these techniques have been made by using the etch pit method (7)(8)(9), decoration method (10), electron microscopy (11)(12)(13). LEED (14), and x -r a y diffraction topography (8,(15)(16)(17)(18)(19).…”

mentioning

confidence: 99%

“…Detailed investigations of perfection of crystals grown by a n u m b e r of these techniques have been made by using the etch pit method (7)(8)(9), decoration method (10), electron microscopy (11)(12)(13). LEED (14), and x -r a y diffraction topography (8,(15)(16)(17)(18)(19).…”

mentioning

confidence: 99%

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Study of Crystal Perfection of CVD‐Grown α ‐ Al2 O 3 Single Crystals by Transmission X‐Ray Diffraction Topography

Lal

Kumar

1978

J. Electrochem. Soc.

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Section: Study Of Crystal Perfection Of Czochralski-grown Crystalssupporting

confidence: 92%

Section: Study Of Crystal Perfection Of Czochralski-grown Crystalssupporting

confidence: 88%

Section: Study Of Crystal Perfection Of Czochralski-grown Crystalsmentioning

confidence: 89%

mentioning

confidence: 99%

mentioning

confidence: 99%

See 3 more Smart Citations

Study of Crystal Perfection of CVD‐Grown α ‐ Al2 O 3 Single Crystals by Transmission X‐Ray Diffraction Topography

Lal

Kumar

1978

J. Electrochem. Soc.

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Einfluß der Substruktur auf die optische Homogenität von Rubin‐Laserstäben

Kvapil

Súlovský

1971

Cryst Res and Technol

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Es wird die Beziehung zwischen der Substruktur und der optischen Homogenitat von aus 90" -Einkristallen herausgeschliffenen Rubin-Laserstaben beschrieben. Die optische Homogenitat wurde interferometrisch und dic Verschwenkung vori Subkoriiern mit der Parallelstrahlmethode und mit dem oszillierenden Spektrographen bestimmt .Dabei wurde festgestellt: Die Komponente der Verschwenkung, welche die Drehung von Subkorriern um die zur Wachstumsachse und zur kristallographischen c-Achse senkrechte Achse verursacht, ist der Zahl der Interfcrcnzlinien proportional.The relation between mosaic structure and optical homogenity was measured of 90" ruby laser rod. The optical homogenity was measured by the interferometric mcthod and the mosaic misorientation by Berg-Barrett method and the oscillation spectrometer respectively.The proportionality between the number of the interferencc stripes and the rotation of the mosaic blocks about an axis perpendicular to the growth axis and crystallographic c-axis was found.

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Synthetic corundum as an X‐Ray monochromator

Belt¹

1972

X-Ray Spectrometry

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Single crystal boules of hexagonal α‐AI2O3 (corundum) were grown by the Czochralski method. The resulting size and crystal quality are appropriate for use as X‐ray monochromators. Eight corundum plates of various 2d spacings were fabricated and evaluated in both an X‐ray diffractometer and emission spectrometer. The corundum data were compared with crystals of ADP, Si, CaF2, Ge, NaCl, LiF, quartz and topaz. For X‐ray diffraction with Cu Kα the corundum (1014) cut is of highest intensity. It is about equal to all other crystals except NaCl (200) and LiF (200). The latter have respectively about 4 and 9 times the corundum intensity. In emissior spectroscopy at wavelengths of 0.1 to 0.5 Å, the corundum (0330) cut is superior to quartz (2023) and topaz (303). The intensity is 2 to 4 times higher for corundum. High resolving power can be attained by the corundum (1456) cut with 2d=1.660 Å. Data and applications are presented for this particularly useful crystal.

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Dislocations and substructure in large 0° Czochralski sapphire crystals

Cited by 7 publications

References 7 publications

Study of Crystal Perfection of CVD‐Grown α ‐ Al2 O 3 Single Crystals by Transmission X‐Ray Diffraction Topography

Study of Crystal Perfection of CVD‐Grown α ‐ Al2 O 3 Single Crystals by Transmission X‐Ray Diffraction Topography

Einfluß der Substruktur auf die optische Homogenität von Rubin‐Laserstäben

Synthetic corundum as an X‐Ray monochromator

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