“…2), giving potential fluctuation strengths s = 12.7, 10.2, and 31.3 meV, and prefactors α which translate into mobility ratios of electrons to holes μ e /μ h = 2.04, 1.85, and 2.36, for the devices CD1, CD2, and UV1, respectively. Table I shows comparisons of the potential fluctuations, due to electron-hole puddles, between the values deduced from our magnetotransport measurements and those found in the literature [5][6][7][8][9], where most of the characterizations are based on STM. Table I also includes the disorder strength (15 ± 1 meV) from our analysis of the published data for SiC/G samples exposed to aqueous-ozone (AO) processing [21], which results in high mobility and extremely low p-type doping with an effective carrier density n eff,0 = −4.0 × 10 10 cm −2 (negative sign for holelike behavior) from Hall measurements.…”