Doped Sb2Te3 narrow-band-gap semiconductors
have been attracting considerable attention for different electronic
and thermoelectric applications. Trivalent samarium (Sm)- and indium
(In)-doped Sb2Te3 microstructures have been
synthesized by the economical solvothermal method. Powder X-ray diffraction
(PXRD) was used to verify the synthesis of single-phase doped and
undoped Sb2Te3 and doping of Sm and In within
the crystal lattice of Sb2Te3. Further, the
morphology, structure elucidation, and stability have been investigated
systematically by scanning electron microscopy (SEM), Raman analysis,
and thermogravimetric analysis (TGA). These analyses verified the
successful synthesis of hexagonal undoped Sb2Te3 (AT) and (Sm, In)-doped Sb2Te3 (SAT, IAT)
microstructures. Moreover, the comparison of dielectric parameters,
including dielectric constant, dielectric loss, and tan loss of AT,
SAT, and IAT, was done in detail. An increment in the electrical conductivities,
both AC and DC, from 1.92 × 10–4 to 4.9 ×
10–3 Ω–1 m–1 and a decrease in thermal conductivity (0.68–0.60 W m–1 K–1) were observed due to the doping
by trivalent (Sm, In) dopants. According to our best knowledge, the
synthesis and dielectric properties of (Sm, In)-doped and undoped
Sb2Te3 in comparison with their electrical properties
and thermal conductivity have not been reported earlier. This implies
that appropriate doping with (Sm, In) in Sb2Te3 is promising to enhance the electronic and thermoelectric behavior.