A new multi-mode electron and ion (MEI) imaging spectrometer with two arms of VMI and COLTRIMS/VMI (velocity map imaging/cold-target recoil-ion momentum spectroscopy) is designed to combine various photoelectron and ion detection modes for experiments at
Shanghai soft X-ray Free-Electron Laser Facility (SXFEL). The experiments can be optionally operated either with both ion and electron detection in a coincidence/covariance manner (VMI arm and COLTRIMS/VMI arm), or only photoelectron/photoion is detected with the high re- solution VMI arm. The simulated resolutions for 30-150 eV photoelectrons and 3.3 eV-18.0 eV N^+ and N^{2+} photoions are up to 1.0% and 3.1%-1.0% according to our simulation, respectively. MEI spectrometer is expected to improve the experimental abilities significantly considering the low-repetition rate of the SXFEL and to enable the investigation of a diverse range of atomic and molecular phenomena triggered by soft X-ray free electron laser irradiation.