Abstract:We obtained evidence for the partial chemical segregation of as-deposited and hydrogenated Mg 1−y Ti y films ͑0 Յ y Յ 0.30͒ into nanoscale Ti and Mg domains using positron Doppler-broadening. We exclusively monitor the hydrogenation of Mg domains, owing to the large difference in positron affinity for Mg and Ti. The electron momentum distribution broadens significantly upon transformation to the MgH 2 phase over the whole compositional range. This reveals the similarity of the metal-insulator transition for ru… Show more
“…Upon hydrogenation, the S-parameter of the Mg 0.70 Ti 0.30 layer reduces significantly in the range of 1-5 keV in positron implantation energy, for which a substantial fraction of positrons annihilates in the metal (hydride) layer. The change in S-parameter is similar in magnitude as for the Mg to MgH 2 transformation in Mg [5][6][7] and Mg 0.90 Ti 0.10 films [7]. Our previous studies [5,15] demonstrated that such a large reduction in S-parameter is a direct result of the metal-insulator transition upon hydrogenation to the MgH 2 phase.…”
Section: Doppler Depth Profiling Of Metal Hydride Thin Filmssupporting
confidence: 54%
“…[7], we showed that the extracted positron lifetime of 312 ± 4 ps for the Mg film indicates that the positron trapping defect is the di-vacancy. The observed saturation trapping also accounted for the very short positron diffusion lengths of less than 5 nm for all Mg 1−y Ti y and Mg 1−y Ti y H x layers, as deduced by the VEPFIT analysis.…”
Section: Positron Lifetime Study On Vacancy-related Defectsmentioning
confidence: 96%
“…[7,8] it was shown that the Mg-Ti films consist of Mg regions which are chemically segregated from Ti domains. The positron detects the presence of Mg domains only, because of the large difference in positron affinity for Mg metal compared with Ti [7], leading to trapping in the Mg regions before annihilation. This enabled us to monitor the metalto-insulator transition in the Mg regions of the Mg 1−y Ti y films exclusively.…”
Section: Double Layer Behavior Of Mg 90 Ti 10 H X Filmsmentioning
confidence: 99%
“…While X-ray diffraction studies indicate that codeposition of Mg and Ti by magnetron sputtering leads to Mg-Ti films with a coherent crystal structure, positron annihilation and EXAFS studies strongly indicate that atomically mixed alloys are not formed. Instead, partial chemical segregation occurs into Mg and Ti domains on a length scale of less than 10 nm [7,8].…”
“…Upon hydrogenation, the S-parameter of the Mg 0.70 Ti 0.30 layer reduces significantly in the range of 1-5 keV in positron implantation energy, for which a substantial fraction of positrons annihilates in the metal (hydride) layer. The change in S-parameter is similar in magnitude as for the Mg to MgH 2 transformation in Mg [5][6][7] and Mg 0.90 Ti 0.10 films [7]. Our previous studies [5,15] demonstrated that such a large reduction in S-parameter is a direct result of the metal-insulator transition upon hydrogenation to the MgH 2 phase.…”
Section: Doppler Depth Profiling Of Metal Hydride Thin Filmssupporting
confidence: 54%
“…[7], we showed that the extracted positron lifetime of 312 ± 4 ps for the Mg film indicates that the positron trapping defect is the di-vacancy. The observed saturation trapping also accounted for the very short positron diffusion lengths of less than 5 nm for all Mg 1−y Ti y and Mg 1−y Ti y H x layers, as deduced by the VEPFIT analysis.…”
Section: Positron Lifetime Study On Vacancy-related Defectsmentioning
confidence: 96%
“…[7,8] it was shown that the Mg-Ti films consist of Mg regions which are chemically segregated from Ti domains. The positron detects the presence of Mg domains only, because of the large difference in positron affinity for Mg metal compared with Ti [7], leading to trapping in the Mg regions before annihilation. This enabled us to monitor the metalto-insulator transition in the Mg regions of the Mg 1−y Ti y films exclusively.…”
Section: Double Layer Behavior Of Mg 90 Ti 10 H X Filmsmentioning
confidence: 99%
“…While X-ray diffraction studies indicate that codeposition of Mg and Ti by magnetron sputtering leads to Mg-Ti films with a coherent crystal structure, positron annihilation and EXAFS studies strongly indicate that atomically mixed alloys are not formed. Instead, partial chemical segregation occurs into Mg and Ti domains on a length scale of less than 10 nm [7,8].…”
“…Three regimes where identified: (1) single fluorite phase for y < 0.87; (2) single phase rutile for y > 0.9 and (3) two phase coexistence for 0.87 < y < 0.90. The presence of a chemically partially segregated but structurally coherent metastable phase in Mg-Ti-H thin films was further confirmed by Extended X-ray Absorption Fine Structure (EXAFS) spectroscopy and by the positron Doppler broadening depth profiling method [94,95]. Positron depth-profiling was also applied to monitor the effects of hydrogenation on thin films [96].…”
Section: Binary and Ternary Mg-based Alloysmentioning
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