2018
DOI: 10.1134/s1063782618070072
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Diversity of Properties of Device Structures Based on Group-III Nitrides, Related to Modification of the Fractal-Percolation System

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Cited by 4 publications
(5 citation statements)
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“…An insignificant increase of current noise density (S I ∝ I) at the frequencies of 20 and 70 Hz on the initial area (I ≤ 10 µA) of the current dependence (Fig. 3) does not allow for making a conclusion on presence of a fractalpercolation system in the samples [6]. A significant increase of noise at I > 0.5 mA for both temperatures (S I ∝ I 2.5 ) can be explained by rearrangement or formation of new defects [16,17], flowing high-density current due to a nonuniform distribution of the carrier stream along the LED structure cross-section [6,16].…”
Section: Discussionmentioning
confidence: 94%
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“…An insignificant increase of current noise density (S I ∝ I) at the frequencies of 20 and 70 Hz on the initial area (I ≤ 10 µA) of the current dependence (Fig. 3) does not allow for making a conclusion on presence of a fractalpercolation system in the samples [6]. A significant increase of noise at I > 0.5 mA for both temperatures (S I ∝ I 2.5 ) can be explained by rearrangement or formation of new defects [16,17], flowing high-density current due to a nonuniform distribution of the carrier stream along the LED structure cross-section [6,16].…”
Section: Discussionmentioning
confidence: 94%
“…3) does not allow for making a conclusion on presence of a fractalpercolation system in the samples [6]. A significant increase of noise at I > 0.5 mA for both temperatures (S I ∝ I 2.5 ) can be explained by rearrangement or formation of new defects [16,17], flowing high-density current due to a nonuniform distribution of the carrier stream along the LED structure cross-section [6,16]. Such changes in the defect spectrum can be due to energy emitted under nonradiative recombination, i.e.…”
Section: Discussionmentioning
confidence: 99%
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“…The observed effects can be explained by the formation of a percolation merged cluster under conditions slightly exceeding the percolation threshold. The technical devices implemented at the percolation threshold are certainly of great interest [48][49][50][51]. In such structures, when interacting with oxygen, the percolation cluster breaks off.…”
Section: Fractal Model Of Porous Sensor Materialsmentioning
confidence: 99%
“…Presently, the trend in electronic devices for power and high frequency application is to shift to wide bandgap semiconductor materials [1][2][3][4]. This shift is caused by the performance threshold achieved by classical semiconductors such as Si, Ge and GaAs.…”
Section: Introductionmentioning
confidence: 99%