Untitled

Maneval, J. P.; Harrabi, Kh.; Lãm, Vũ Đình; Boyer, F.; Ladan, F. R.

doi:10.1023/a:1021094819107

Cited by 1 publication

(1 citation statement)

References 5 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…On the other hand, when the heating level is small, investigation of phase-slip centers or phase-slip lines is usually performed by current-biased measurements (including nanosecond pulse techniques) [7][8][9][10][11]. In particular, by studying the temporal behavior of current-driven wide bridges (w > λ ⊥ ), pulse techniques have been used to distinguish between hotspot and phase-slip phenomena [12,13]. The main observation was that, in constant current feed, phase-slip centers are stable in time while hotspots grow with no other limit than complete transition of the whole sample.…”

Section: Introductionmentioning

confidence: 99%

Stabilization of non-self-spreading hotspots in current- and voltage-biased superconducting NbN microstrips

Adam

Piraux

Michotte

et al. 2009

Supercond. Sci. Technol.

View full text Add to dashboard Cite

Electrical transport measurements were performed on superconducting NbN multicontact microstrips in order to investigate non-equilibrium dissipative states in type-II nanostructures. Current-biased and voltage-biased approaches point out the ability to stabilize a normal phase that grows discontinuously, in opposition to the usual self-spreading hotspot propagation. Results obtained by applying a dc voltage to two segments in series support this idea of a peculiar hotspot expansion. This last voltage-biasing configuration, which involves five contacts, could be used in the future to distinguish more easily between hotspot discontinuous growth and phase-slippage mechanisms.

show abstract