1993
DOI: 10.1016/0038-1101(93)90098-b
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DLTS evaluation of nonexponential transients of defect levels in cuprous oxide (Cu2O)

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Cited by 19 publications
(17 citation statements)
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“…Although the p-type conduction properties of Cu 2 O have been studied extensively for decades, [15][16][17][18][19] the exact nature of the hole states found in the forbidden energy gap of Cu 2 O has been a source of much controversy, with acceptorlike states being reported in the range 0.12-0.70 eV. [20][21][22][23][24][25][26][27] Deep level transient spectroscopy ͑DLTS͒ has shown the presence of hole traps 0.40-0.55 eV above the top of the valence band maximum ͑VBM͒. 26,28 These hole traps have been attributed to structural anomalies such as CuO "islands."…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Although the p-type conduction properties of Cu 2 O have been studied extensively for decades, [15][16][17][18][19] the exact nature of the hole states found in the forbidden energy gap of Cu 2 O has been a source of much controversy, with acceptorlike states being reported in the range 0.12-0.70 eV. [20][21][22][23][24][25][26][27] Deep level transient spectroscopy ͑DLTS͒ has shown the presence of hole traps 0.40-0.55 eV above the top of the valence band maximum ͑VBM͒. 26,28 These hole traps have been attributed to structural anomalies such as CuO "islands."…”
Section: Introductionmentioning
confidence: 99%
“…[20][21][22][23][24][25][26][27] Deep level transient spectroscopy ͑DLTS͒ has shown the presence of hole traps 0.40-0.55 eV above the top of the valence band maximum ͑VBM͒. 26,28 These hole traps have been attributed to structural anomalies such as CuO "islands." 26 Similar conclusions were reached regarding the acceptor levels in DLTS study of Cd-doped Cu 2 O.…”
Section: Introductionmentioning
confidence: 99%
“…Within this composition window, we obtain predicted band gap energies between 1.4 (x Cd = y Se = 0.2) and 2.5 eV (x Mg = 0.2) from the values given in Table II, compared to the 2.1 eV room temperature gap of Cu 2 O [50]. Whereas the binary oxide Cu 2 O is always p-type conducting within a narrow window p = 10 14 − 10 16 cm −3 [25,39,51] we find the alloying approach allows a much better control of the electrical properties. Due to the pronounced dopantdefect interaction, alloying of S and Se increases the ptype doping, up to the 10 18 cm −3 range for y Se > 0.02 (Fig.…”
Section: Discussionmentioning
confidence: 92%
“…However, other studies suggested that this effect could better be interpreted as a correction factor on Gaussian distributions. 17 Batovski and Hardalov 18 pointed out that the distribution function could be more complicated and asymmetric in considering the spin degeneracy and lattice relaxation during the carrier capture and emission processes. They suggested an inverse theory to transform the thermal spectrum directly into a defect energy distribution spectrum.…”
Section: Introductionmentioning
confidence: 99%