2004
DOI: 10.1103/physrevlett.93.068101
|View full text |Cite
|
Sign up to set email alerts
|

DNA Strand Breaks Induced by 0–4 eV Electrons: The Role of Shape Resonances

Abstract: Collisions of 0-4 eV electrons with thin DNA films are shown to produce single strand breaks. The yield is sharply structured as a function of electron energy and indicates the involvement of pi* shape resonances in the bond breaking process. The cross sections are comparable in magnitude to those observed in other compounds in the gas phase in which pi* electrons are transferred through the molecule to break a remote bond. The results therefore support aspects of a theoretical study by Barrios et al. [J. Phys… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

26
459
2
13

Year Published

2005
2005
2010
2010

Publication Types

Select...
4
3
1

Relationship

0
8

Authors

Journals

citations
Cited by 474 publications
(500 citation statements)
references
References 20 publications
26
459
2
13
Order By: Relevance
“…The lowest peak in the modeled capture cross-section, which occurs at 0.39 eV in the gas phase, was shifted by 0.41 eV to match that in the SSB yield. The necessity of introducing this positive shift could be explained by the phosphate charge which in DNA is relatively close to the bases, thus producing a net destabilization which slightly exceeds that of the polarization induced by the transient anion [18]. The good agreement between the experimental and simulated SSBs yield functions in the 0-4 eV range may be considered as a strong argument confirming the involvement of shape resonances localized on nucleobases in the formation of LEE-induced strand breaks in DNA.…”
Section: Dna Damage Induced By Low Energy Electronsmentioning
confidence: 53%
See 2 more Smart Citations
“…The lowest peak in the modeled capture cross-section, which occurs at 0.39 eV in the gas phase, was shifted by 0.41 eV to match that in the SSB yield. The necessity of introducing this positive shift could be explained by the phosphate charge which in DNA is relatively close to the bases, thus producing a net destabilization which slightly exceeds that of the polarization induced by the transient anion [18]. The good agreement between the experimental and simulated SSBs yield functions in the 0-4 eV range may be considered as a strong argument confirming the involvement of shape resonances localized on nucleobases in the formation of LEE-induced strand breaks in DNA.…”
Section: Dna Damage Induced By Low Energy Electronsmentioning
confidence: 53%
“…On the other hand, at lower energies the cleavage process is due to the formation of transient resonance anions [1,2,[15][16][17][18]. Thus, the SSB and DSB maxima on the yield function observed around 8 and 10 eV (Figure 21-3), [12].…”
Section: Dna Damage Induced By Low Energy Electronsmentioning
confidence: 99%
See 1 more Smart Citation
“…The Feshbach resonance with a hole in the n O oxygen lone pair orbital appears as a weaker peak at 7.85 eV in the D À /EtOD spectrum and as an indistinct shoulder at the same energy in the (M À 1) À /EtOH spectrum. 3 Comparison of selected DEA spectra with vibrational excitation cross-sections (measured at 1351) and photoelectron spectra for ethanol (2). The PE spectrum is shown shifted by À4.65 eV; a weak sharp peak due to a N 2 impurity is marked.…”
Section: Methanol (1)mentioning
confidence: 99%
“…9,10 In order to estimate the effect of electrons (and other negative species) on plasmid DNA, a high transmission metallic mesh was placed in front of the sample. A negative potential up to À30 V with respect to ground was applied to the mesh to suppress the electron flux reaching the sample from plasma jet.…”
mentioning
confidence: 99%