Domain observation in MnBi films with the scanning electron microscope

Atkinson, R.; Jones, G. A.

doi:10.1088/0022-3727/9/11/004

Cited by 12 publications

(4 citation statements)

References 9 publications

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“…This is because no or weak type-I magnetic contrast is observed [6,4], or the film studied is damaged during the process of drying the colloid. But fortunately, thin magnetic films can be imaged with high spatial resolution by TEM [3].…”

Section: Resultsmentioning

confidence: 99%

Imaging magnetic microstructures with the use of electrons

Szmaja

Balcerski

Makita³

2006

Phys. Status Solidi (c)

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The paper presents investigations of magnetic microstructures by techniques which make use of electrons. In this context, we refer to the examples of magnetic microstructure images of cobalt monocrystals, NdFe-B permanent magnet and a thin permalloy film, while the methods used are the type-I magnetic contrast technique of scanning electron microscopy (SEM), the colloid-SEM method and the Fresnel mode of transmission electron microscopy (TEM). It is shown that the SEM type-I magnetic contrast and the colloid-SEM method have quite different probing depths and consequently provide useful complementary information on the magnetic microstructure at the surface of bulk materials which exhibit an out-of-plane component of magnetization. It is also demonstrated that TEM is a powerful tool for investigating the magnetic microstructure of thin magnetic films. Some improvements over previous results are presented.

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Section: Resultsmentioning

confidence: 99%

Imaging magnetic microstructures with the use of electrons

Szmaja

Balcerski

Makita³

2006

Phys. Status Solidi (c)

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“…This image is noisy, although it was recorded under optimal experimental conditions; the same is also true for the suitable images shown in Refs. [1,3,7,8]. For the present therefore, the signal-to-noise ratio appears to be the crucial factor limiting the resolution of the type-I magnetic contrast method.…”

Section: Resultsmentioning

confidence: 99%

Improvements and actual problems in domain imaging by type-I magnetic contrast in SEM

Szamja

2002

Czech J Phys

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Improvements in domain observation by the scanning electron microscope (SEM) type-I magnetic contrast have been achieved thanks to the use of digital image processing (DIP) system. Domain images with considerably enhanced contrast and reduced noise can be obtained. By combining image alignment with image subtraction and summation techniques, it is possible at present to separate superimposed magnetic and non-magnetic features in the images taken with a single secondary electron detector. As a consequence, detailed studies of domain structures in the cases of very weak type-I contrast and complex domain patterns, which were not possible before, can now be made. The actual problems related to the complicated mechanism of type-I magnetic contrast and its relatively low resolution are also discussed.PA CS : 75.60.-d

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“…Samples which can be examined by this method include magnetic recording heads and tapes, and uniaxial crystals such as cobalt which have strong external fields (Dorsey, 1966;Vertsner et al, 1966;Banbury & Nixon, 1967;Joy & Jakubovics, 1968;Saparin et al, 1968;Speth, 1969;Wardly, 1971;Cort & Steeds, 1972;Griffiths et al, 1972;Hothersall et al, 1972;Wellsetal., 1974;Yamamoto & Tsuno, 1975;Dunketal., 1975;Atkinson & Jones, 1976;Wells, 1983b).…”

Section: Introductionmentioning

confidence: 99%

“…(1) If the sample is a magnetic tape or recording head, then the fringing fields can be examined in scanning transmission with the sample at glancing incidence by either: the TH method (Thornley & Hutchison, 1968;Ishiba & Suzuki, 1974), the Schlieren method (Marton, 1948;Wells & Brunner, 1983), conformal mapping (Wells, 1983a), or by automated versions of these techniques (Rau & Spivak, 1980) (2) If a sample having fringing fields is examined by the secondary electron (SE) imaging method, then these fields can give rise to type-l magnetic contrast if the SE detector is directionally sensitive. Samples which can be examined by this method include magnetic recording heads and tapes, and uniaxial crystals such as cobalt which have strong external fields (Dorsey, 1966;Vertsner et al, 1966;Banbury & Nixon, 1967;Joy & Jakubovics, 1968;Saparin et al, 1968;Speth, 1969;Wardly, 1971;Cort & Steeds, 1972;Griffiths et al, 1972;Hothersall et al, 1972;Wellsetal., 1974;Yamamoto & Tsuno, 1975;Dunketal., 1975;Atkinson & Jones, 1976;Wells, 1983b).…”

Section: Introductionmentioning

confidence: 99%

Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope

Wells

1985

Journal of Microscopy

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KEY WORDS. Difference image, fluxon unit, Fourier methods, Gauss' theorem, Heisenberg uncertainty principle, magnetic induction, magnetic recording head, magnetic tape, Neumann's problem, quantum limit, scanning electron microscope (SEM), secondary electrons (SE), uniaxial magnetic material, uniqueness theorem for magnetic fields. SUMMARY Type-1 magnetic contrast can be obtained in the secondary electron (SE) image in the SEM from a sample having an external magnetic field if the SE detector is directionally sensitive. Gauss' theorem is applied to show that the normal component of induction at the surface of the sample can be calculated from the measured spatial derivative(s) of the SE difference-signal. A method is given in this paper for calculating the three components of the induction in the entire volume above the sample surface. Reasons are given for believing that type-1 magnetic contrast is limited in spatial resolution by the fluxon unit.

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Domain observation in MnBi films with the scanning electron microscope

Cited by 12 publications

References 9 publications

Imaging magnetic microstructures with the use of electrons

Imaging magnetic microstructures with the use of electrons

Improvements and actual problems in domain imaging by type-I magnetic contrast in SEM

Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope

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