2017
DOI: 10.1016/j.mssp.2016.11.006
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Doping of III-nitride materials

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Cited by 96 publications
(63 citation statements)
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“…To explore relative stability of different doping models, the formation energies which can usually describe the difficulty of forming doped structure are calculated and discussed. And formation energy formulas for doping model under N‐rich condition and Ga‐rich condition are described as 33‐35 : EformN=EdopedEpure+nμGanμX+qEf EformGa=EdopedEpure+nμNnμX+qEf …”
Section: Resultsmentioning
confidence: 96%
“…To explore relative stability of different doping models, the formation energies which can usually describe the difficulty of forming doped structure are calculated and discussed. And formation energy formulas for doping model under N‐rich condition and Ga‐rich condition are described as 33‐35 : EformN=EdopedEpure+nμGanμX+qEf EformGa=EdopedEpure+nμNnμX+qEf …”
Section: Resultsmentioning
confidence: 96%
“…composition Al x Ga 1-x N. 19,20 This is different from MBE-grown Al x Ga 1-x N films where dopant incorporation was found to be independent of the Al-composition of the film. 16,17 Thus, while MBE can achieve degenerately doped Al-composition graded contact layer using the same growth condition, a continuous shift in optimum dopant incorporation condition makes growing such uniformly high doped Al-composition graded Al x Ga 1-x N films challenging for MOCVD.…”
Section: Usamentioning
confidence: 82%
“…The transition between the exhaustion regime and the intrinsic regime mark the temperature limit for a semiconductor device, called intrinsic temperature. Hence the importance, in the case of applications in high temperature, to push to the maximum this transition if one defines the intrinsic temperature as the temperature where the intrinsic concentration ( ) becomes comparable or equal to the concentration of the impurities net doping 9 ( ) = | − | (5)…”
Section: Intrinsic Temperaturementioning
confidence: 99%