1994
DOI: 10.1016/0304-3991(94)90039-6
|View full text |Cite
|
Sign up to set email alerts
|

Double conical beam-rocking system for measurement of integrated electron diffraction intensities

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

2
499
0
6

Year Published

2004
2004
2018
2018

Publication Types

Select...
6
3

Relationship

0
9

Authors

Journals

citations
Cited by 694 publications
(507 citation statements)
references
References 13 publications
2
499
0
6
Order By: Relevance
“…Despite such low-dose settings relatively short exposure times up to 1s need to be selected in the case of high-resolution images. Another breakthrough for the investigation of air sensitive samples is given by the precession electron diffraction technique (PED) [11][12][13][14][15]. The PED technique with the electron beam moving on a precession cone (precession angle of 3°) minimizes multiple scattering and beyond that is superior to selected area electron diffraction (SAED, fixed beam), since the PED experiments overcome the time consuming adjustment of the precise zone axis orientation of the sample.…”
Section: Experimental and Methodsmentioning
confidence: 99%
“…Despite such low-dose settings relatively short exposure times up to 1s need to be selected in the case of high-resolution images. Another breakthrough for the investigation of air sensitive samples is given by the precession electron diffraction technique (PED) [11][12][13][14][15]. The PED technique with the electron beam moving on a precession cone (precession angle of 3°) minimizes multiple scattering and beyond that is superior to selected area electron diffraction (SAED, fixed beam), since the PED experiments overcome the time consuming adjustment of the precise zone axis orientation of the sample.…”
Section: Experimental and Methodsmentioning
confidence: 99%
“…It utilizes, however, a precession movement of the primary electron beam around the microscope's optical axis rather than that of a zone axis of a single crystal around a fixed primary X-ray beam direction [3]. Due to the much larger radius of the Ewald sphere, the precession angles are in FED only a few degrees, i.e.…”
Section: Precession Electron Diffractionmentioning
confidence: 99%
“…The primary electron beam and the diffracted beams are de-scanned (after they have left the nanocrystal) in such a manner that stationary diffraction patterns are obtained on the viewing screen of the TEM or on the recoding medium underneath this screen [3]. Figure 2 shows a sketch that illustrates the sequential creation of a zero order Laue zone FED pattern for a single crystal.…”
Section: Precession Electron Diffractionmentioning
confidence: 99%
“…The use of a special diffraction technique first introduced by Vincent andMidgley in 1994~Vincent &Midgley, 1994! has seen widespread use within the electron microscopy community as a tool to help overcome these problems Weirich et al, 2006!.…”
Section: Introductionmentioning
confidence: 99%