Double Injection, Resonant-Tunneling Recombination, and Current-Voltage Characteristics in Double-Graphene-Layer Structures *

Ryzhii, M.; Ryzhii, V.; T., Otsuji,; Maltsev, P. P.; Leiman, V. G.; Ryabova, N.; Mitin, V.

doi:10.1201/9780429328398-46

Graphene-Based Terahertz Electronics and Plasmonics 2020

DOI: 10.1201/9780429328398-46

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Double Injection, Resonant-Tunneling Recombination, and Current-Voltage Characteristics in Double-Graphene-Layer Structures *

M. Ryzhii¹,

V. Ryzhii²,

Otsuji, T.³

et al.

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Double Injection, Resonant-Tunneling Recombination, and Current-Voltage Characteristics in Double-Graphene-Layer Structures *

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