2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) 2021
DOI: 10.1109/vlsi-tsa51926.2021.9440093
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Double-Layer Amorphous InGaZnO Thin Film Transistors with High Mobility and High Reliability

Song-Ling Li
1
,
Ming-Xuan Lee
2
,
Chueh-Chuan Yen
3
et al.
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