Drain current model of double-gate MOSFETs considering both electrons and holes

Abstract

We present a rigorously derived current solution for undoped double‐gate (DG) MOSFETs with two carriers, which is based on surface potentials. The third‐order Newton–Raphson (NR) method is used to solve the surface‐potential equations resulting from the application of the boundary conditions to the general Poisson solution, with an initial guess very close to the true solution. The results demonstrate surface‐potential solutions for DG MOSFETs with 2–7 iterations to achieve an accuracy of 10−15. The drain current model for two carriers is presented as a benchmark to test the accuracy of one‐carrier current approximation. © 2014 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.