Drift compensation in dual start/stop data acquisition positron lifetime measurements

Yamawaki, Masato; Uesugi, Naoya; Ando, Hirokazu; Kobayashi, Yoshinori

doi:10.35848/1347-4065/ab6f2d

Cited by 6 publications

(3 citation statements)

References 12 publications

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“…Furthermore, we reported that the drift in the positron lifetime spectrum, caused by temporal instability of photomultiplier and high-voltage power supply can be corrected using dual start stop data acquisition. 19,20) On comparing the behaviors of the centre-of-gravity positron lifetime, the "mean" positron lifetime and ΔT 0 , we observed that the first two markedly change only in lowdefect-density regions, while the third showed a considerable change in the high defect densities but with complicated dependency on defect density. Based on this fact, obtaining information about the defects in a wide-density range from the positron lifetime data may be possible by combining multiple parameters with varying dependencies on the defect density.…”

Section: Introductionmentioning

confidence: 88%

Feasibility study of non-destructive defect analysis by positron annihilation lifetime measurement

Yamawaki

Uesugi²,

Kobayashi

2020

Jpn. J. Appl. Phys.

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We examined the feasibility of on-site non-destructive defect analysis using positron annihilation lifetime measurement. This analysis requires a short measurement time and lattice defect information has to be extracted from positron lifetime data that involve high statistical uncertainties. In this study, we simulated positron lifetime spectra for a short measurement of approximately 1 min, using experimental positron lifetimes of shot-peened stainless steel, and studied the variations of the center-of-gravity positron lifetime, the “mean” positron lifetime and the shift in the starting time (ΔT 0) with the positron trapping rate into defects, which is a physical quantity proportional to the lattice defect density. As a result, distinguishing the positron lifetime spectra of different trapping rates in a range of up to 1 × 1011 s−1 was possible by creating a 2D plot of the “mean” positron lifetime and ΔT 0.

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Section: Introductionmentioning

confidence: 88%

Feasibility study of non-destructive defect analysis by positron annihilation lifetime measurement

Yamawaki

Uesugi²,

Kobayashi

2020

Jpn. J. Appl. Phys.

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“…In this study, the positron annihilation lifetime measurement was performed using the commercial system, PSA TypeL-II [8][9][10][11] manufactured by TOYO SEIKO Co., Ltd. (Fig. 1).…”

Section: Methodsmentioning

confidence: 99%

Development of a method for positron annihilation lifetime measurement in thin polyethylene films using a Na-22 source

Yamawaki¹,

Uesugi²,

Oka³

et al. 2020

Jpn. J. Appl. Phys.

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Positron annihilation lifetime measurements were performed on polyethylene films [low-density polyethylene and ultra-high molecular weight polyethylene (UHMWPE)] with a thickness of 15–2000 μm using a Na-22 positron source enclosed in a Kapton film. For thin films, some positrons will pass through the film and annihilate behind it. Using a single film in a commercial anti-coincidence system, by placing an annealed stainless steel (SUS304) cover behind the sample, it is possible to sufficiently measure the long-lifetime ortho-positronium (o-Ps) component even in thin films. Additionally, calculated intensities of the o-Ps component determined from the estimated film transmittance agreed well with the measured values. Furthermore, by applying this method to uniaxially stretched UHMWPE, we were able to observe structural changes owing to the stretching consistent with shorter measured o-Ps lifetime and increased o-Ps intensity.

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“…Precise determination of ΔT 0 is possible with the anti-coincidence positron lifetime measurement [8]. If the anti-coincidence lifetime measurement is combined with dual start/stop data acquisition [9], ΔT 0 can be determined even more precisely. As a result of the simulation, it was clarified that different positron lifetime spectra with large statistical errors can be distinguished in a wide region of trapping rates up to 10 11 s −1 by using the two-dimensional plot of ΔT 0 and τm [10].…”

Section: Introductionmentioning

confidence: 99%

Estimation of lattice defect density by positron annihilation lifetime measurement in a short time

Yamawaki

Uesugi²,

Kobayashi

2023

JJAP Conf. Proc.

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The possibility of on-site and nondestructive inspection of lattice defects, such as those caused by metal fatigue, through positron annihilation lifetime measurement has been investigated by simulation. In such inspection of defects, short-time measurement is essential. Therefore, it is important to extract as much as possible information on lattice defects from positron annihilation data with large statistical errors. To extract this information, a master curve representing two-dimensional change of the "mean" positron lifetime (τ m ) and the starting time shift (ΔT 0 ) with positron trapping rate (proportional to defect density) was obtained in advance. ΔT 0 and τm were determined by single-component analysis of the positron lifetime spectrum, taking account of the source component. Then, the trapping rate was estimated by specifying a corresponding position on the master curve, which is based on the interpolation of ΔT 0 and τm , obtained by short-time measurement of about one minute. The result of the investigation elucidated that the trapping rate can be sufficiently estimated.

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Drift compensation in dual start/stop data acquisition positron lifetime measurements

Cited by 6 publications

References 12 publications

Feasibility study of non-destructive defect analysis by positron annihilation lifetime measurement

Feasibility study of non-destructive defect analysis by positron annihilation lifetime measurement

Development of a method for positron annihilation lifetime measurement in thin polyethylene films using a Na-22 source

Estimation of lattice defect density by positron annihilation lifetime measurement in a short time

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