1993
DOI: 10.1016/0030-4018(93)90651-k
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Droplet target for low-debris laser-plasma soft X-ray generation

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Cited by 135 publications
(53 citation statements)
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“…EUV metrology growth should keep up with the development of other EUV technologies. To address these problems, debris-free sources and droplet mitigation systems are under construction for EUV metrology purposes [5][6][7][8][9][10][11][12][13]. Nevertheless, much work remains to be done in this field.…”
Section: Introductionmentioning
confidence: 99%
“…EUV metrology growth should keep up with the development of other EUV technologies. To address these problems, debris-free sources and droplet mitigation systems are under construction for EUV metrology purposes [5][6][7][8][9][10][11][12][13]. Nevertheless, much work remains to be done in this field.…”
Section: Introductionmentioning
confidence: 99%
“…Many of the above mentioned advantages are also true for liquid targets. 19,20 However, few experiments using short laser pulses ͑Ͻ1 ps͒ to produce x-ray emitting plasmas from liquid targets have been carried out 21 and the temporal structure of the emission has yet to be studied.…”
Section: Introductionmentioning
confidence: 99%
“…The choice in target material involves a different emission spectrum; in contrast to the Kr gas target, the liquid methanol jet emits a line spectrum, which is ideally suited for x-ray microscopy. The plasma has a high spatial stability (25 µm at FWHM) [157] and a narrow spectral bandwidth of ∆λ λ = 2 × 10 −3 at λ = 3.37 nm (= 368 eV). A detailed description of the cTXM is found in Takman et al [191], Hertz et al [74] and Bertilson [21].…”
Section: Compact Transmission X-ray Microscopementioning
confidence: 99%