2015
DOI: 10.1007/978-3-319-10295-5
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Dry Etching Technology for Semiconductors

Abstract: The use of general descriptive names, registered names, trademarks, service marks, etc. in this publication does not imply, even in the absence of a specifi c statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. While the advice and information in this book are believed to be true and accurate at the date of publication, neither the authors nor the editors nor the publisher can accept any legal responsibility for any errors or omissions tha… Show more

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Cited by 137 publications
(91 citation statements)
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“…2(a), to maintain critical dimension of the mask. 12,13 The most extensively used process is reactive ion etching (RIE), which is a type of (dry) plasma etching involving a partially ionized plasma glow discharge that provides a mixture of reactive and nonreactive ions, electrons, reactive neutrals, passivating species, and photons. Directionality for positively charged ions is provided by accelerating them normal to the wafer surface through a negative voltage bias on the wafer substrate.…”
Section: Limitations Of Continuous Etchingmentioning
confidence: 99%
See 1 more Smart Citation
“…2(a), to maintain critical dimension of the mask. 12,13 The most extensively used process is reactive ion etching (RIE), which is a type of (dry) plasma etching involving a partially ionized plasma glow discharge that provides a mixture of reactive and nonreactive ions, electrons, reactive neutrals, passivating species, and photons. Directionality for positively charged ions is provided by accelerating them normal to the wafer surface through a negative voltage bias on the wafer substrate.…”
Section: Limitations Of Continuous Etchingmentioning
confidence: 99%
“…33 However, plasma chlorination considerably increases the possibility of background etching due to the presence of radicals, ions, photons, metastables, and low energy electrons, all of which can potentially induce etching. 13 Photons may play a role, as they are known to induce subthreshold etching as described by Shin et al 100 Low energy ions should not etch at subthreshold energies (<16 eV), although molecular dynamic simulations by Brichon et al show a finite silicon etching yield for chlorine ions with kinetic energies as low as 5 eV. 20 Even "nonreactive" species in plasma such as He neutrals can deliver substantial (>10 eV) energy through relaxation of Rydberg states.…”
Section: Argon Ion Bombardmentmentioning
confidence: 99%
“…microelectronics, semiconductors, material engineering, etc., where low-pressure discharge plasmas have been utilized for a long time with practical levels of industry. For example, in the microelectronics engineering, dry etching processes have been widely applied for more than 30 years for the commercial fabrication of memories [7], where typically, fluorine radicals are generated from fluorocarbon gases in the argon-based low-temperature plasmas like CCP [8,9], ICP [10,11], ECR plasmas [12,13], or others, and applied to material etching out of the substrate. On the other hand, for thin-film deposition processes like photovoltaic-device manufacturing, silicon-based materials are quite often deposited on substrates from the SiH 4 or other siliconcompound gaseous molecules [14,15].…”
Section: Introductionmentioning
confidence: 99%
“…2, a schematic diagram for plasma reaction and etching process occurring in the material is summarized. 17) In the etching with the use of plasma, particles ionized by granting electrical energy in the state of neutral gas are used. And, by granting electrical energy to CF 4 , O 2 and Ar neutral gas, the ionization processes can be shown approximately by the equations (1), (2) and 3, respectively.…”
Section: Resultsmentioning
confidence: 99%