Dual-Failure Restorability of Meta-Mesh Networks

Castillo, Andres; Nakashima-Paniagua, Tetsuhei; Doucette, John

doi:10.1109/rndm.2018.8489819

Cited by 1 publication

(3 citation statements)

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“…The meta‐mesh design model is a refinement of the conventional span restoration mechanism that allows a greater spare capacity efficiency on sparse network topologies, in particular via the introduction of logical bypass spans to effectively short‐circuit the end‐nodes of a chain . In order to explain how this method functions, we revisit the example previously shown in . Consider the four‐nodes chain shown in Figure , with the specified working and spare capacity values, w i and s i , respectively.…”

Section: Prior Workmentioning

confidence: 99%

“…Spare capacity requirements in a chain under a span‐restorable design [Color figure can be viewed at wileyonlinelibrary.com]…”

Section: Prior Workmentioning

confidence: 99%

“…Some works have addressed dual or multiple failures in various network settings , however, not many works have addressed this problem using the meta‐mesh approach. Initial efforts to investigate higher‐order failures in meta‐mesh networks were presented in . Following that work, our focus now in the present work is to more fully analyze the behavior of meta‐mesh restoration in the face of dual failures, and develop a new integer linear programming (ILP) design model to determine an optimal capacity placement that will minimize the amount of nonrestored lightpaths in the event of dual‐failure scenarios.…”

Section: Introductionmentioning

confidence: 99%

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Dual‐failure restorability analysis of span‐restorable meta‐mesh networks

2020

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The span‐restorable meta‐mesh model was previously designed as a cutting‐edge technique that enhanced the spare capacity efficiency in low average nodal degree networks. In this technique, lightpaths that fully traverse chains of degree‐2 nodes are provided with a logical express bypass span allowing a distinction between the internal and external working flow capacity that transit the chain. In the event of span failure, lightpaths which would normally traverse the chain in its entirety are allowed to fail back to its anchor nodes such that only the intrachain flow requires allocation of spare capacity. Previous work on the meta‐mesh design considered only single failure restorability. The work herein analyzes dual span failure situations by developing two new integer linear programming models. The first model provides the minimum total cost of designing a meta‐mesh network capable of withstanding dual span failure scenarios. The second model offers a maximization of the dual failure restorability by minimizing the number of nonrestored working capacities with a given limit of total spare capacity investment. Experiments are performed on six master test‐case networks of various topologies and scales.

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Section: Prior Workmentioning

confidence: 99%

“…Spare capacity requirements in a chain under a span‐restorable design [Color figure can be viewed at wileyonlinelibrary.com]…”

Section: Prior Workmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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