Dual harmonic Kelvin probe force microscopy for surface potential measurements of ferroelectrics

Collins, Liam; Kilpatrick, Jason I.; Bhaskaran, Madhu; Sriram, Sharath; Weber, Stefan A. L.; Jarvis, Suzanne P.; Rodriguez, Brian J.

doi:10.1109/isaf.2012.6297845

Cited by 17 publications

(27 citation statements)

References 22 publications

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“…The first approach is to operate KPFM in non-polar liquids, 12 where the absence of mobile ions effectively suppresses electrochemical processes. The second is to utilize open loop KPFM modes, which do not require bias feedback, [13][14][15][16][17] [13][14][15][16][17] to measure and compare CPD values recorded on a model system in both air and milliQ water. To allow a meaningful comparison between air and liquid measurements, and to determine the influence of the imaging environment on CPD measurements, we study graphene, a material known to have stable electrochemical behavior over a large bias range when immersed in liquid.…”

Section: -3mentioning

confidence: 99%

“…[12][13][14][15][16] DH-KPFM measurements were performed in lift mode using an AFM (Asylum Research, MFP-3D), a lock in amplifier (Zurich Instruments, HF2LI), and as-received Pt/Ircoated (Nanosensors, PPP-EFM) AFM probes with a nominal mechanical resonance frequency and spring constant of 75 kHz and 2.8 N/m, respectively. To prepare the sample investigated in this study, graphene was deposited by chemical vapor deposition on Cu foil (Alfa Aesar, #13382).…”

Section: -3mentioning

confidence: 99%

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Dual harmonic Kelvin probe force microscopy at the graphene–liquid interface

Collins

Kilpatrick

Vlassiouk

et al. 2014

Applied Physics Letters

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Kelvin probe force microscopy (KPFM) is a powerful technique for the determination of the contact potential difference (CPD) between an atomic force microscope tip and a sample under ambient and vacuum conditions. However, for many energy storage and conversion systems, including graphene-based electrochemical capacitors, understanding electrochemical phenomena at the solid–liquid interface is paramount. Despite the vast potential to provide fundamental insight for energy storage materials at the nanoscale, KPFM has found limited applicability in liquid environments to date. Here, using dual harmonic (DH)-KPFM, we demonstrate CPD imaging of graphene in liquid. We find good agreement with measurements performed in air, highlighting the potential of DH-KPFM to probe electrochemistry at the graphene–liquid interface.

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Section: -3mentioning

confidence: 99%

Section: -3mentioning

confidence: 99%

Dual harmonic Kelvin probe force microscopy at the graphene–liquid interface

Collins

Kilpatrick

Vlassiouk

et al. 2014

Applied Physics Letters

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“…Furthermore, negating the requirement for feedback, and hence the need to apply a dc bias, makes OL-KPFM techniques a promising development with numerous potential applications including the investigation of voltage sensitive materials [29,30], time-resolved SP measurements [31,32] (OL is not limited by the bandwidth of the feedback loop), 3-dimensional-KPFM [33] (where feedback effects in CL-KPFM introduce a distance dependence), as well as SP measurements in liquid [34][35][36]. Here, we demonstrate single frequency (dual harmonic (DH)) and multifrequency (band excitation (BE)) OL-KPFM techniques, which are then directly compared in situ to CL-KPFM.…”

Section: Introductionmentioning

confidence: 99%

Open loop Kelvin probe force microscopy with single and multi-frequency excitation

et al. 2013

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Abstract. Conventional Kelvin probe force microscopy (KPFM) relies on closed loop (CL) bias feedback for the determination of surface potential (SP). However, SP measured by CL-KPFM has been shown to be strongly influenced by the choice of measurement parameters due to non-electrostatic contributions to the input signal of the bias feedback loop. This often leads to systematic errors of several hundred mV and can also result in topographical crosstalk. Here, open loop (OL)-KPFM modes are investigated as a means of obtaining a quantitative, crosstalk free measurement of the SP of graphene grown on Cu foil, and are directly contrasted with CL-KPFM. OL-KPFM operation is demonstrated in both single and multi-frequency excitation regimes, yielding quantitative SP measurements. The SP difference between single and multilayer graphene structures using OL-KPFM was found to be 63 ± 11 mV, consistent with values previously reported by CL-KPFM. Furthermore, the same relative potential difference between Al 2 O 3 -coated graphene and Al 2 O 3 -coated Cu was observed using both CL and OL techniques. We observe an offset of 55 mV between absolute SP values obtained by OL and CL techniques, which is attributed to the influence of non-electrostatic contributions to the input of the bias feedback used in CL-KPFM.

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“…29,32 These parameters can result in systematic errors of hundreds of millivolts in the recorded V cpd , in an instrument specific way, making comparison between experiments or with theory difficult. 27,28 Several attempts to negate these artifacts present in conventional KPFM have been pursued through the development of KPFM techniques based on heterodyne detection, 17 dual harmonic detection in open 27,33 and closed loop, 34 as well as band excitation (BE)-KPFM. 29,35 Another significant problem in AM-KPFM measurements is stray capacitive coupling between different parts of the probe architecture and sample surface under test, which limits the achievable resolution of KPFM measurements.…”

Section: Band Excitation Kelvin Probe Force Microscopy Utilizing Photmentioning

confidence: 99%

Band excitation Kelvin probe force microscopy utilizing photothermal excitation

Collins

Jesse

Balke

et al. 2015

Applied Physics Letters

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A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizing photothermal as opposed to electrical excitation is developed. Photothermal band excitation (PthBE)-KPFM is implemented here in a grid mode on a model test sample comprising a metal-insulator junction with local charge-patterned regions. Unlike the previously described open loop BE-KPFM, which relies on capacitive actuation of the cantilever, photothermal actuation is shown to be highly sensitive to the electrostatic force gradient even at biases close to the contact potential difference (CPD). PthBE-KPFM is further shown to provide a more localized measurement of true CPD in comparison to the gold standard ambient KPFM approach, amplitude modulated KPFM. Finally, PthBE-KPFM data contain information relating to local dielectric properties and electronic dissipation between tip and sample unattainable using conventional single frequency KPFM approaches.

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Dual harmonic Kelvin probe force microscopy for surface potential measurements of ferroelectrics

Cited by 17 publications

References 22 publications

Dual harmonic Kelvin probe force microscopy at the graphene–liquid interface

Dual harmonic Kelvin probe force microscopy at the graphene–liquid interface

Open loop Kelvin probe force microscopy with single and multi-frequency excitation

Band excitation Kelvin probe force microscopy utilizing photothermal excitation

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