Frontiers in Optics 2006
DOI: 10.1364/oft.2006.oftuc2
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Dual Interferometer System for Measuring Index of Refraction

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Cited by 4 publications
(3 citation statements)
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“…57 Another system measured the index of refraction of the hydrogel materials. 58 The most recent system was designed to measure the surface profile of both sides of the contact lens. 59 The combination of measurements from these three systems allows for a complete characterization of the optical properties of the contact lens.…”
Section: Research Background and Historymentioning
confidence: 99%
“…57 Another system measured the index of refraction of the hydrogel materials. 58 The most recent system was designed to measure the surface profile of both sides of the contact lens. 59 The combination of measurements from these three systems allows for a complete characterization of the optical properties of the contact lens.…”
Section: Research Background and Historymentioning
confidence: 99%
“…The index match between the solution and the contact lens material results in a reduced Fresnel reflectance. Based on measurements of the lens material 10,11 and saline, 9 the power reflectivity of either contact lens surface is only 0.06% at the wavelength of the source. Each air-lens interface in the transmission sphere has nearly four times the reflectivity, even with 0.25% antireflection coatings.…”
Section: Interferometer Designmentioning
confidence: 99%
“…The index of refraction of the contact lens material was determined by a dual interferometer system. 10,11 It uses a low-coherence TwymanGreen interferometer along with a Mach-Zehnder interferometer in transmission to measure the phase and group indices of refraction to an accuracy of 0.0001. The thickness is also required for a full description of a contact lens and has been characterized in several ways, 12,13 but it will also be determined by the interferometer described in this paper.…”
Section: Introductionmentioning
confidence: 99%