A long-term test with a two-layer solid oxide cell stack was carried out for more than 20,000 hours. The stack was mainly characterized in a furnace environment in electrolysis mode, with 50% humidification of H 2 at 800 • C. The endothermic operation was carried out with a current density of −0.5 Acm −2 and steam conversion rate of 50%. Electrolysis at lower temperatures (i.e., 700 • C and 750 • C) and fuel cell operation (with 0.5 Acm −2 and fuel utilization of 50%) at 800 • C were also carried out (<2000 h each) for comparison. The voltage and area specific resistance degradation rates were ∼0.6%/kh and 8.2%/kh after ∼18,460 hours of operation. In total, the stack was operated above 700 • C for more than 20,000 hours. Impedance measurement and analysis showed that the increase of ohmic resistance was the main degradation phenomenon, while electrode polarizations were kept nearly constant before a severe burning took place in one layer. Ni-depletion in fuel electrodes was confirmed during post-mortem analysis, which was assumed to be the major degradation mechanism observed. The stack performance and degradation analysis under different working conditions, as well as the results of preliminary post-mortem analysis will be presented. One of the critical challenges to the application and commercialization of solid oxide cell (SOC) technology is the long-term stability of complete systems, stacks and single components. Despite the fact that accelerating methods have long been under discussion, the time-consuming and costly endurance tests of stacks and cells under relevant conditions are still necessary for reliable degradation analyses and lifetime prediction. Compared to the tests with single cell or other stack and system component, the results of long-term degradation tests with stacks are quite limited. [1][2][3][4][5] Previous results have shown stable performance of stacks working in the temperature range of 700-800• C in SOFC mode. [6][7][8][9] Recently, a short stack achieved a 10 years lifetime, and remains in operation. 10 With proper protective coating, a voltage degradation rate of less than 0.3%/kh and lifetime of more than 40,000 h at 700• C is possible with current stack design and components. In contrast to the low degradation rate in SOFC mode, higher degradation rates of ∼0.6-1.5%/kh were observed with similar types of cells in the same stack design in SOEC mode, as described by Nguyen et al. 11 Therefore, the functionality and optimization potential of the cells and stacks, as well as their long-term degradation behavior and mechanisms in SOEC mode, needs to be further investigated. Amongst the stacks operated in SOEC mode, a two-layer stack was operated under different stationary conditions for more than 20,000 h. The stack performance was regularly monitored by open circuit voltage, voltage-current curves and impedance measurements. After cooling down, one third of the stack was embedded in resin for cross-section preparation, and the rest was disassembled for visual inspection. The prelim...