Dynamic control of the batch processor in a serial-batch processor system with mean tardiness performance

Cerekci, Abdullah; Banerjee, Amarnath

doi:10.1080/00207540802641437

Cited by 15 publications

(6 citation statements)

References 22 publications

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“…To minimise the sum of weighted tardiness, Vepsalainen and Morton (1987) develop an index called apparent tardiness cost (ATC), which assigns the priority on the basis of the expected tardiness cost per immediate processing requirements. An evolution of this index is presented by Cerekci and Banerjee (2010). They focus on mean tardiness performance of a batch machine in a two-stage system by including an upstream unit capacity machine.…”

Section: Literature Reviewmentioning

confidence: 99%

Scheduling batches with time constraints in wafer fabrication

Pirovano

Ciccullo

Pero

et al. 2020

IJOR

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This work proposes and tests an algorithm for batching and dispatching lots along cleaning and diffusion operations of a wafer fab. These are characterised by: 1) time constraints (i.e., the time between the end of an operation 'n' and the start of the operation 'n + q' must be lower than a time limit, in order to guarantee the lots' quality); 2) absence of batching affinity between operations. Literature so far has been falling short in proposing scheduling algorithms suitable for this context. Therefore, we propose two heuristic algorithms to minimise the average flow time and the number of re-cleaned lots, maximise machine saturation and avoid scrapped lots. Discrete-event simulation was used to test the performance of the two algorithms using real data of STMicroelectronics. The formerly proposed model outperforms the latter. Therefore, STMicroelectronics implemented the former in its fab in Catania gaining an increase in the average Overall equipment effectiveness of 7%.

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Section: Literature Reviewmentioning

confidence: 99%

Scheduling batches with time constraints in wafer fabrication

Pirovano

Ciccullo

Pero

et al. 2020

IJOR

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“…LBCR use CR calculation and adapted it in NACH, onestep look-ahead logic. Cerecki and Banerjee [16] present NACH-T, a multiple-products look-ahead strategy which consider to calculate minimum tardiness for each product type at each future arrival and then calculate the effects of each product tardiness on all product types. The product with smallest mean tardiness metric value will be loaded at a time which created minimum tardiness value.…”

Section: Problem Description and Previous Workmentioning

confidence: 99%

A Batching Strategy for Batch Processing Machine with Multiple Product Types

Mansoer¹,

Koo²

2014

JIII

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This paper presents a dynamic batching heuristic for controlling batch processing machine in semiconductor manufacturing. The batch processing machines process several jobs, at the same time, as a batch. When a batch process machine complete its task and ready to start new process, real-time loading strategies should be made to check whether it is best to start the process right away with current products in queue, or to wait for the upcoming products. A new real-time batching heuristic is proposed in multiple-product type single-machine environment with tardiness minimization as a key performance measure. Look-ahead information about future job arrivals is incorporated in decision making. Simulation experiments show that the new batching strategy provides performance of good quality. 

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“…Most of the literature has used stochastic process for arrivals such as exponential distribution (Cerekci and Banerjee 2010;Fowler, Phillips, and Hogg 1992;Van Der Zee, Van Harten, and Schuur 2001), and for solving the bi-criteria problem, the subjective weight for tardiness has been specified by decision maker. However, in a stochastic process, the probability function which indicates the values of the relationship between the two variables, a random variable and independent variable, can be derived.…”

Section: Introduction Of the Stochastic Utility Evaluation (Sue) Funcmentioning

confidence: 99%

A new dynamic scheduling for batch processing systems using stochastic utility evaluation function

Park

Banerjee

2011

Proceedings of the 2011 Winter Simulation Conference (WSC)

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In long production cycles, the earliness and tardiness weight (utility) of products vary depending on the time. It is necessary to reflect the weight of products for earliness and tardiness at decision epochs to decide on the optimal strategy. This research demonstrates the use of Stochastic Utility Evaluation (SUE) function approach to optimize system performance using multiple criteria. In addition, this research explores how SUE function using stochastic information can be derived and used to strategically improve existing approaches. SUE function for earliness and tardiness is used in an existing model to develop a triobjective problem. Typically, this problem is very complex to solve due to its trade-off relationship. However SUE function makes it relatively easy to solve the tri-objective problem since SUE function can be incorporated in an existing model. It is observed that SUE function can be effectively used for solving a tri-objective problem. INTRODUCTIONThe semiconductor industry has continued to be an important field of research in recent years because of the widespread use of integrated circuits (IC) in devices ranging from personal computers to high-tech electronics. Due to the growth of the semiconductor market, research in IC fabrication technology and methodology is steadily expanding. Wafer production is a very complex process with a long production cycle; and much of the complexity results from batching, time-step, and sequencing problems at several stages of the cycle. The majority of problem-solving methods attempt to minimize production attributes such as cycle time, earliness and tardiness (Mathirajan and Sivakumar 2006). Most often, the batch process itself is the bottleneck, particularly since competing factors come into play for the important decision to run a partial batch versus waiting for future arrivals to form a full batch. On-time delivery and rapid production of wafers are the two critical factors affecting the retention of customers and influencing the performance of manufacturer. Diffusion furnaces are the most commonly used batch processors in semiconductor production. Yet while they can handle a batch of products concurrently, their processing times are too slow compared to serial processors that handle one product at a time. This research analyzes forthcoming performance-enhancing measures in the decision-making phase of batch processing that aid in controlling batch processors. At the decision epoch, most models use a static weight for product type; however, if earliness and tardiness are considered at the decision point, the dynamic weight for product type needs to be estimated according to stochastic information in the long-run control of a batch processor and multiple product types. 2302978-1-4577-2109-0/11/$26.00 ©2011 IEEE

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Dynamic control of the batch processor in a serial-batch processor system with mean tardiness performance

Cited by 15 publications

References 22 publications

Scheduling batches with time constraints in wafer fabrication

Scheduling batches with time constraints in wafer fabrication

A Batching Strategy for Batch Processing Machine with Multiple Product Types

A new dynamic scheduling for batch processing systems using stochastic utility evaluation function

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