Dynamic crystal rotation resolved by high-speed synchrotron X-ray Laue diffraction

Huang, Jiawei; Huang, Jing; Sun, Tao; Fezzaa, Kamel; Luo, Sheng‐Nian

doi:10.1107/s160057751600223x

Cited by 4 publications

(3 citation statements)

References 26 publications

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“…Similar to ref. [24], quantitative analysis of each individual diffraction pattern is then achieved by comparing these paths to the ones produced by the relative rotation 8 of the Au crystal along the nanowire around defined crystallographic axes.The orientation matrix after a certain rotation is described with the following equation…”

Section: Laue Microdiffraction Data Analysismentioning

confidence: 99%

Three-point bending behavior of a Au nanowire studied by in-situ Laue micro-diffraction

Ren

Cornelius

Leclère

et al. 2018

Journal of Applied Physics

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The elastic and plastic deformation of a gold nanowire tested in three-point bending configuration using the custom-built scanning force microscope SFINX was studied in-situ by Laue micro-diffraction. A new data treatment method, which bases on the integration of diffraction patterns recorded along the deformed nanostructure, is introduced visualizing both movement and shape of the diffraction peaks as a function of the measurement position. Besides bending, torsion is evidenced during the elastic deformation originating from a misalignment of the SFINX-tip of the order of 60 nm with respect to the nanowire center. As demonstrated by post-mortem Laue micro-diffraction maps, the plastic deformation is governed by the storage of geometrically necessary dislocations. Analyzing the shape of the diffraction peaks, the activation of two unexpected slip systems is found which does not coincide with the slip systems with the highest resolved shear stress. These unexpected slip systems are probably related to the dislocation nucleation process at the clamping point, which is influenced by the local curvature.

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Section: Laue Microdiffraction Data Analysismentioning

confidence: 99%

Three-point bending behavior of a Au nanowire studied by in-situ Laue micro-diffraction

Ren

Cornelius

Leclère

et al. 2018

Journal of Applied Physics

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“…Crackingassisted local domain rotation may have occurred during shock loading, giving rise to extra displacement of a diffraction spot along the 2θ direction, and thus, an augmented apparent lattice strain. 2,23 Besides peak shift and rotation, the diffraction peaks demonstrate non-negligible broadening. Such broadening is mainly due to localized domain rotation, as previously suggested.…”

Section: Resultsmentioning

confidence: 99%

Simultaneous, single-pulse, synchrotron x-ray imaging and diffraction under gas gun loading

Fan

Huang

Zeng

et al. 2016

Review of Scientific Instruments

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We develop a mini gas gun system for simultaneous, single-pulse, x-ray diffraction and imaging under high strain-rate loading at the beamline 32-ID of the Advanced Photon Source. In order to increase the reciprocal space covered by a small-area detector, a conventional target chamber is split into two chambers: a narrowed measurement chamber and a relief chamber. The gas gun impact is synchronized with synchrotron x-ray pulses and high-speed cameras. Depending on a camera's capability, multiframe imaging and diffraction can be achieved. The proof-of-principle experiments are performed on single-crystal sapphire. The diffraction spots and images during impact are analyzed to quantify lattice deformation and fracture; fracture is dominated by splitting cracks followed by wing cracks, and diffraction peaks are broadened likely due to mosaic spread. Our results demonstrate the potential of such multiscale measurements for studying high strain-rate phenomena at dynamic extremes.

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“…X-ray phase contrast imaging (XPCI) is advantageous for resolving dynamic fracture and fragmentation of nontransparent brittle materials owing to its edge enhancement, strong penetration capability, and high temporal (µs) and spatial (µm) resolutions [24][25][26][27]. The diffraction spots yield 3D information on lattice deformation or rotation [28,29], beneficial to understanding of micro-scale deformation and damage of material-s [30][31][32]. Simultaneous dynamic x-ray imaging and diffraction have been established at the beamline 32-ID of the Advanced Photon Source (APS) [32][33][34], with a split Hopkinson pressure/tension bar (SHPB/SHTB) implemented for dynamic loading.…”

Section: Introductionmentioning

confidence: 99%

Dynamic deformation and fracture of single crystal silicon: Fracture modes, damage laws, and anisotropy

et al. 2016

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Impact fracture of single-crystal Si is critical to long-term reliability of electronic devices and solar cells for its wide use as components or substrates in semiconductor industry. Single-crystal Si is loaded along two different crystallographic directions with a split Hopkinson pressure bar integrated with an in situ x-ray imaging and diffraction system. Bulk stress histories are measured, simultaneously with x-ray phase contrast imaging (XPCI) and Laue diffraction. Damage evolution is quantified with grayscale maps from XPCI. Single-crystal Si exhibits pronounced anisotropy in fracture modes, and thus fracture strengths and damage evolution. For loading along [110] and viewing along [001] directions, (110) [110] cleavage is activated and induce horizontal primary cracks followed by perpendicular wing cracks. However, when loading along [011] and viewing along [111] directions, random nucleation and growth of shear and tensile-splitting crack networks lead to catastrophic failure of materials with no cleavage. The primarywing crack mode leads to a lower characteristic fracture strength due to predamage, but a more concentrated strength distribution, i.e., a higher Weibull modulus, compared to the second loading case. Moreover, the sequential primary cracking, wing cracking and wing-crack coalescence processes result in a gradual increase of damage with time, deviating from theoretical predictions. Particle size and aspect ratios of fragments are discussed with postmortem fragment analysis, which verifies fracture modes observed in XPCI.

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Dynamic crystal rotation resolved by high-speed synchrotron X-ray Laue diffraction

Cited by 4 publications

References 26 publications

Three-point bending behavior of a Au nanowire studied by in-situ Laue micro-diffraction

Three-point bending behavior of a Au nanowire studied by in-situ Laue micro-diffraction

Simultaneous, single-pulse, synchrotron x-ray imaging and diffraction under gas gun loading

Dynamic deformation and fracture of single crystal silicon: Fracture modes, damage laws, and anisotropy

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