2015
DOI: 10.1109/jetcas.2015.2502160
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Dynamic Element Matching Techniques for Static and Dynamic Errors in Continuous-Time Multi-Bit <formula formulatype="inline"><tex Notation="TeX">$\Delta\Sigma$</tex></formula> Modulators

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Cited by 19 publications
(50 citation statements)
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“…Similar to Shui et al 12 and Sanyal et al, [14][15][16] we monitor both the up (1 → 0) and down (0 → 1) transitions. The ETR during the transition from the (i−1)th clock cycle to the ith clock cycle, represented as C i , can be calculated as…”
Section: Etr Of Traditional Dacsmentioning
confidence: 89%
See 3 more Smart Citations
“…Similar to Shui et al 12 and Sanyal et al, [14][15][16] we monitor both the up (1 → 0) and down (0 → 1) transitions. The ETR during the transition from the (i−1)th clock cycle to the ith clock cycle, represented as C i , can be calculated as…”
Section: Etr Of Traditional Dacsmentioning
confidence: 89%
“…However, the range of the controllable ETR in those techniques [12][13][14][15][16] requires restrictions on the minimal oversampling rate (OSR) and the maximal swing in the input digital code even if redundant current sources are used. While keeping a certain number of current sources from being switched, these techniques can precisely control the number of switching operations, achieving significant improvement of in-band linearity and noise performance in low-speed applications, such as the high-resolution audio DACs.…”
Section: Introductionmentioning
confidence: 99%
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“…However, matched components are very difficult or nearly impossible to realize on silicon since mismatch errors always exist in real implementation. Several techniques were applied to reduce or eliminate the effect of component mismatch errors such as enlarge the devices, digital calibration, self-calibration, error-averaging or dynamic element matching [1,2]. Dynamic Element Matching (DEM) is one of the techniques applied in DAC to reduce component mismatch error.…”
Section: Introductionmentioning
confidence: 99%