Dynamic in-line analysis of electrostatic discharge resistive-capacitive time constant

Generation and Storage of Random Voltage Values via Ring Oscillators Comprising Feedback Field-Effect Transistors

“…The ring oscillator effectively maintained the V OUT value for an initial holding time of 200 s, and the average degradation of the V OUT value was only 10.6%. The retention time was defined as the time at which the initial V OUT value decreased to 63% of its original value following the standard time constant principle [31]. The average V OUT retention time of the ring oscillator was estimated to be approximately 5500 s, demonstrating robust memory stability.…”

“…These operations are beneficial for security applications, offering a robust method for generating and storing PUF keys in several ring oscillators [33,34]. The retention time was defined as the time at which the initial VOUT value decreased to 63% of its original value following the standard time constant principle [31]. The average VOUT retention time of the ring oscillator was estimated to be approximately 5500 s, demonstrating robust memory stability.…”