2024
DOI: 10.1109/jphot.2024.3401142
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Dynamic Modeling of Stress-Induced Defect Expansion in VCSELs

Yuqi Zhang,
Xun Li,
Jia Zhao

Abstract: Many failures of semiconductor-based oxide confined vertical cavity surface emitting lasers (VCSELs) are closely related to the generation and expansion of defects in the device structure. However, existing research has predominantly focused on the static study of defect morphology, with little attention given to analyzing the dynamic process of defect expansion, which limited our ability to predict device random failures due to lack of understandings on defect generation and expansion. To address this issue, … Show more

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