2011
DOI: 10.1109/tcsi.2011.2163894
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Dynamic NBTI Management Using a 45 nm Multi-Degradation Sensor

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Cited by 34 publications
(36 citation statements)
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“…Such structures are inserted (in a sparse manner) to capture hardware characteristics of interest. Several examples exist in the literature to monitor various circuit characteristics (e.g., achievable frequency [23], leakage power [24], or aging [25]). The challenge is to minimize the overheads introduced by the monitoring circuits; these overheads take the form of area, delay, and/or power, as well as design complexity while retaining accuracy.…”
Section: B Runtime Sensing Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Such structures are inserted (in a sparse manner) to capture hardware characteristics of interest. Several examples exist in the literature to monitor various circuit characteristics (e.g., achievable frequency [23], leakage power [24], or aging [25]). The challenge is to minimize the overheads introduced by the monitoring circuits; these overheads take the form of area, delay, and/or power, as well as design complexity while retaining accuracy.…”
Section: B Runtime Sensing Methodsmentioning
confidence: 99%
“…One area of recent work in monitors that could be employed in UnO machines are aging sensors that estimate or measure the degree of aging (for different mechanisms, such as negative bias temperature instability, NBTI, or oxide degradation for example) that a particular chip has experienced. One design was presented in [25], where a unified NBTI and gateoxide wear-out sensor was demonstrated in a 45 nm CMOS technology. With a very small area, sprinkling hundreds or even thousands of such sensors throughout a design becomes feasible, providing a fairly reliable indication of system expected lifetime.…”
Section: B Runtime Sensing Methodsmentioning
confidence: 99%
“…Traditional post-silicon reactive dynamic NBTI management techniques typically employ NBTI sensors [28], [29], that provide ΔVth measurement with 3σ accuracy of 1.23 mV for a wide range of temperatures. However, these sensors incur area as well as power overheads.…”
Section: Virtual Sensingmentioning
confidence: 99%
“…Recent work also presents sensors for monitoring degradation [13], and embeds them in prototypes [14], [17].…”
Section: Introductionmentioning
confidence: 99%